Abstract: A device for detecting defects on at least one painted surface may include: a source configured to emit electromagnetic radiation, in at least one first spectral band, in order to project a beam of the radiation onto the at least one painted surface; a video camera sensitive in at least one second spectral band and configured to obtain images of the at least one painted surface in a zone where the beam of the radiation emitted by the source is projected; and a diffuser configured to intercept at least part of the radiation emitted by the source and to make more homogeneous a spatial distribution of radiation intensity over the at least one painted surface. A spectral working band of the device is the at least one first spectral band, the at least one second spectral band, or an intersection of the at least one first and second spectral bands.

Abstract: A device for detecting defects on at least one painted surface may include: a source configured to emit electromagnetic radiation, in at least one first spectral band, in order to project a beam of the radiation onto the at least one painted surface; a video camera sensitive in at least one second spectral band and configured to obtain images of the at least one painted surface in a zone where the beam of the radiation emitted by the source is projected; and a diffuser configured to intercept at least part of the radiation emitted by the source and to make more homogeneous a spatial distribution of radiation intensity over the at least one painted surface. A spectral working band of the device is the at least one first spectral band, the at least one second spectral band, or an intersection of the at least one first and second spectral bands.

Abstract: A device for detecting defects on at least one surface may include: a source configured to emit electromagnetic radiation in at least one first spectral band; a video camera sensitive in at least one second spectral band; and a diffuser configured to intercept at least part of the electromagnetic radiation emitted by the source and to make more homogeneous a spatial distribution of intensity of the electromagnetic radiation over the at least one surface. The source may be further configured to project a beam of the electromagnetic radiation onto the at least one surface. An intersection of the at least one first spectral band and the at least one second spectral band may determine a spectral working band. A bandwidth of the spectral working band may be less than or equal to 200 nanometers (nm). The spectral working band may be between 300 nm and 1,100 nm.

Abstract: A method for localizing defects on a complex surface of an object may include: realizing an acquisition assembly with an electromagnetic wave emission device and an optoelectronic device for detecting electromagnetic waves reflected by the complex surface; defining a scan path at a distance from the complex surface; and during a defect search procedure: moving the acquisition assembly along the path; defining instants during the moving of the acquisition assembly at which the acquisition assembly acquires an image of the complex surface as a two-dimensional pixel matrix of the optoelectronic device; storing consecutive two-dimensional pixel matrices obtained along the path; storing coordinates of the acquisition assembly along the scan path and associating the coordinates with respective two-dimensional matrices of the consecutive two-dimensional pixel matrices; locating detects in the consecutive two-dimensional pixel matrices; and/or determining spatial coordinates of the defects detected in the matrix usin

Abstract: A device for detecting defects on at least one surface may include: a source configured to emit electromagnetic radiation in at least one first spectral band; a video camera sensitive in at least one second spectral band; and a diffuser configured to intercept at least part of the electromagnetic radiation emitted by the source and to make more homogeneous a spatial distribution of intensity of the electromagnetic radiation over the at least one surface. The source may be further configured to project a beam of the electromagnetic radiation onto the at least one surface. An intersection of the at least one first spectral band and the at least one second spectral band may determine a spectral working band. A bandwidth of the spectral working band may be less than or equal to 200 nanometers (nm). The spectral working band may be between 300 nm and 1,100 nm.