Patents by Inventor Bryan A. Stanfill

Bryan A. Stanfill has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Sensing analytical instrument parameters, specimen characteristics, or both from sparse datasets
    Patent number: 10541109
    Abstract: Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.
    Type: Grant
    Filed: July 26, 2017
    Date of Patent: January 21, 2020
    Assignee: BATTELLE MEMORIAL INSTITUTE
    Inventors: Bryan A. Stanfill, Sarah M. Reehl, Margaret C. Johnson, Lisa M. Bramer, Nigel D. Browning, Andrew J. Stevens, Libor Kovarik
  • SENSING ANALYTICAL INSTRUMENT PARAMETERS, SPECIMEN CHARACTERISTICS, OR BOTH FROM SPARSE DATASETS
    Publication number: 20180033591
    Abstract: Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.
    Type: Application
    Filed: July 26, 2017
    Publication date: February 1, 2018
    Applicant: BATTELLE MEMORIAL INSTITUTE
    Inventors: Bryan A. Stanfill, Sarah M. Reehl, Margaret C. Johnson, Lisa M. Bramer, Nigel D. Browning, Andrew J. Stevens, Libor Kovarik