Abstract: An apparatus for removing debris from a surface employs an air jet to lift the debris from the surface and then vacuums the lifted debris into a container.

Abstract: A drive circuit for an integrated circuit tester produces an output test signal in response to an input sequence of vector data values, wherein each vector data value references a test signal state and a time at which the test signal is to change to the referenced state. The drive circuit includes decoding and timing circuits for producing an indicating signal (D) of the state referenced by each incoming vector data value and a timing signal (TD) having a pulse occurring at the time referenced by the incoming vector data value. An event phase modulator within the drive circuit stores a control bit indicating the state of the indicating signal in response to each pulse of the timing signal. The event phase modulator waits for a variable amount of time after storing each control bit and then forwards the control bit to the input of a driver producing the test signal. The driver sets the test signal state in accordance with the state of the control bit.