Patents by Inventor Bryan H. Hoyer

Bryan H. Hoyer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110099410
    Abstract: For synchronizing a master device and a slave device connected by a data transfer link, the master device measures a phase offset in a signal received from the slave device with respect to the master's clock signal. The master determines a control symbol based on the phase offset. The master encodes the control symbol in a transmit signal for the slave. The slave decodes the control symbol from the signal received from the master. The slave uses the control symbol to adjust the phase shift to compensate for the phase offset of a signal to be transmitted to the master device. When the phase compensated signal is received at the master, its phase offset is smaller than the original phase offset. This procedure can be performed iteratively until the phase offset is within a desired tolerance.
    Type: Application
    Filed: January 6, 2011
    Publication date: April 28, 2011
    Inventors: John Yin, Bryan H. Hoyer
  • Publication number: 20110099408
    Abstract: For synchronizing a master device and a slave device connected by a data transfer link, the master device measures a phase offset in a signal received from the slave device with respect to the master's clock signal. The master determines a control symbol based on the phase offset. The master encodes the control symbol in a transmit signal for the slave. The slave decodes the control symbol from the signal received from the master. The slave uses the control symbol to adjust the phase shift to compensate for the phase offset of a signal to be transmitted to the master device. When the phase compensated signal is received at the master, its phase offset is smaller than the original phase offset. This procedure can be performed iteratively until the phase offset is within a desired tolerance.
    Type: Application
    Filed: January 6, 2011
    Publication date: April 28, 2011
    Inventors: John Yin, Bryan H. Hoyer
  • Patent number: 7890788
    Abstract: For synchronizing a master device and a slave device connected by a data transfer link, the master device measures a phase offset in a signal received from the slave device with respect to the master's clock signal. The master determines a control symbol based on the phase offset. The master encodes the control symbol in a transmit signal for the slave. The slave decodes the control symbol from the signal received from the master. The slave uses the control symbol to adjust the phase shift to compensate for the phase offset of a signal to be transmitted to the master device. When the phase compensated signal is received at the master, its phase offset is smaller than the original phase offset. This procedure can be performed iteratively until the phase offset is within a desired tolerance.
    Type: Grant
    Filed: July 9, 2007
    Date of Patent: February 15, 2011
    Inventors: John Yin, Bryan H. Hoyer
  • Publication number: 20090015304
    Abstract: For synchronizing a master device and a slave device connected by a data transfer link, the master device measures a phase offset in a signal received from the slave device with respect to the master's clock signal. The master determines a control symbol based on the phase offset. The master encodes the control symbol in a transmit signal for the slave. The slave decodes the control symbol from the signal received from the master. The slave uses the control symbol to adjust the phase shift to compensate for the phase offset of a signal to be transmitted to the master device. When the phase compensated signal is received at the master, its phase offset is smaller than the original phase offset. This procedure can be performed iteratively until the phase offset is within a desired tolerance.
    Type: Application
    Filed: July 9, 2007
    Publication date: January 15, 2009
    Inventors: John Yin, Bryan H. Hoyer
  • Patent number: 6754862
    Abstract: Internal registers of a PLD are exposed for debugging using a JTAG port and a scan chain. The user of a PLD identifies registers at the source code level. These registers are automatically inserted in a scan chain. An EDA software tool provides a means of choosing a register from the electronic design. The EDA tool connects the selected register to the JTAG scan chain and passes information to the software about the location in the scan chain. The EDA tool provides for scanning of the chain under automatic or manual control. The selected nodes are extracted from the chain and displayed in a user-specified format. Registers in encrypted blocks are exposed. The vendor of the block decides which registers are of importance. Once selected, the vendor creates a “debugging” file which is delivered to the customer along with the encrypted block. The debugging file contains the names of the registers, their data type, and their symbolic values.
    Type: Grant
    Filed: March 9, 2001
    Date of Patent: June 22, 2004
    Assignee: Altera Corporation
    Inventors: Bryan H. Hoyer, Michael C. Fairman