Patents by Inventor Bryan James Mock

Bryan James Mock has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus of echo planar imaging with real-time determination of phase correction coefficients
    Patent number: 7420370
    Abstract: The present invention provides an apparatus and method of phase correction whereby changes in phase characteristics are measured during data acquisition and, accordingly, phase correction parameters that are applied during image reconstruction are updated in real-time. This adaptive and dynamic phase correction reduces variability in image fidelity during the course of long MR scans, such as EPI scans, and provides consistent artifact reduction during the course of an MR scan.
    Type: Grant
    Filed: August 20, 2007
    Date of Patent: September 2, 2008
    Assignee: General Electric Company
    Inventors: Richard Scott Hinks, Bryan James Mock, Frederick Joseph Frigo, Xiaoli Zhao
  • Method and system for image artifact reduction using nearest-neighbor phase correction for echo planar imaging
    Patent number: 7102352
    Abstract: A nearest neighbor phase correction technique is implemented to reduce image artifacts due to phase errors in data acquired in an EPI scan. Image quality for EPI applications, such as DWI, DTI, and fMRI, is improved.
    Type: Grant
    Filed: March 17, 2005
    Date of Patent: September 5, 2006
    Assignee: General Electric Company
    Inventors: Richard Scott Hinks, Bryan James Mock, Bruce David Collick, Frederick Joseph Frigo, Tejaswini Shubhachint