Patents by Inventor Bryan Stanfill

Bryan Stanfill has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240090995
    Abstract: Certain aspects of the present disclosure provide techniques for performing surgical ophthalmic procedures, such as cataract surgeries. An example method of determining one or more intraocular lens (IOL) parameters for an IOL to be used in a cataract surgery procedure includes generating, using a fused machine learning model, recommendations including one or more IOL parameters for the IOL to be used in the cataract surgery based, at least in part, on first predicted lens behavior for each of one or more IOLs by an emulated finite element analysis (EFEA) model and the second predicted lens behavior for each of the one or more IOLs by an IOL power calculator (IPC) machine learning model.
    Type: Application
    Filed: September 7, 2023
    Publication date: March 21, 2024
    Inventors: Robert Dimitri Angelopoulos, William Jacob Spenner Dolla, Bryan Stanfill
  • Publication number: 20220198654
    Abstract: A system and method for augmenting an original OCT (optical coherence tomography) image includes a controller having a processor and a tangible, non-transitory memory on which instructions are recorded. The system includes one or more learning modules selectively executable by the controller. The learning modules are trained by a training network with a training dataset having a plurality of training ultrasound bio-microscopy images and respective training OCT images. Execution of the instructions by the processor causes the controller to obtain the original OCT image, captured through an OCT device. The controller is configured to generate an augmented OCT image based in part on the original OCT image, by executing the (trained) learning modules. The augmented OCT image at least partially extends a peripheral portion of the original OCT image.
    Type: Application
    Filed: October 21, 2021
    Publication date: June 23, 2022
    Inventors: Sinchan Bhattacharya, Hyo Won Choi, Ramesh Sarangapani, Bryan Stanfill
  • Publication number: 20220151482
    Abstract: A method for estimating biometric landmark dimensional measurements of a human eye includes, in a possible embodiment, receiving one or more images of the human eye via a host computer. In response to receiving the one or more images, the method includes generating a preliminary set of landmark point locations in the one or more images via the host computer using a deep-learning algorithm, and then refining the preliminary set of landmark point locations using a post-hoc processing routine of the host computer to thereby generate a final set of estimated landmark point locations. Additionally, the biometric landmark dimensional measurements are automatically generated via the host computer using the final set of estimated landmark point locations. A data set is then output that is inclusive of the set of estimated landmark point locations. A host computer that executes instructions from memory to perform the method.
    Type: Application
    Filed: October 14, 2021
    Publication date: May 19, 2022
    Inventors: Robert Dimitri Angelopoulos, Bryan Stanfill
  • Patent number: 10541109
    Abstract: Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.
    Type: Grant
    Filed: July 26, 2017
    Date of Patent: January 21, 2020
    Assignee: BATTELLE MEMORIAL INSTITUTE
    Inventors: Bryan A. Stanfill, Sarah M. Reehl, Margaret C. Johnson, Lisa M. Bramer, Nigel D. Browning, Andrew J. Stevens, Libor Kovarik
  • Publication number: 20180033591
    Abstract: Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.
    Type: Application
    Filed: July 26, 2017
    Publication date: February 1, 2018
    Applicant: BATTELLE MEMORIAL INSTITUTE
    Inventors: Bryan A. Stanfill, Sarah M. Reehl, Margaret C. Johnson, Lisa M. Bramer, Nigel D. Browning, Andrew J. Stevens, Libor Kovarik