Patents by Inventor Bryan W. Reed
Bryan W. Reed has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11676796Abstract: A charged particle beam device including: a charged particle beam source which emits a charged particle beam; a blanking device which has an electrostatic deflector that deflects and blocks the charged particle beam; an irradiation optical system which irradiates a specimen with the charged particle beam; and a control unit which controls the electrostatic deflector, the control unit performing processing of: acquiring a target value of a dose of the charged particle beam for the specimen; setting a ratio A/B of a time A during which the charged particle beam is not blocked to a unit time B (where A?B, A?0), based on the target value; and operating the electrostatic deflector based on the ratio.Type: GrantFiled: September 13, 2021Date of Patent: June 13, 2023Assignee: JEOL Ltd.Inventors: Kazuki Yagi, Yu Jimbo, Bryan W. Reed, Ruth Shewmon Bloom
-
Publication number: 20230072991Abstract: A charged particle beam device scans a specimen with a charged particle beam and generates an image based on a detected signal from a detector that detects a signal generated from the specimen based on the scan performed by the charged particle beam. The charged particle beam device includes: a blanker that performs blanking of the charged particle beam; an image acquisition unit that acquires a plurality of images by controlling the blanking during the scan performed by the charged particle beam, the plurality of images including pixels corresponding to a region of the specimen that is irradiated with the charged particle beam and pixels corresponding to a region of the specimen that is not irradiated with the charged particle beam; and an integrated image generation unit that generates an integrated image by integrating the plurality of acquired images.Type: ApplicationFiled: September 7, 2022Publication date: March 9, 2023Inventors: Hiroki Hashiguchi, Kazuki Yagi, Ruth Shewmon Bloom, Bryan W. Reed
-
Publication number: 20220084783Abstract: A charged particle beam device including: a charged particle beam source which emits a charged particle beam; a blanking device which has an electrostatic deflector that deflects and blocks the charged particle beam; an irradiation optical system which irradiates a specimen with the charged particle beam; and a control unit which controls the electrostatic deflector, the control unit performing processing of: acquiring a target value of a dose of the charged particle beam for the specimen; setting a ratio A/B of a time A during which the charged particle beam is not blocked to a unit time B (where A?B, A?0), based on the target value; and operating the electrostatic deflector based on the ratio.Type: ApplicationFiled: September 13, 2021Publication date: March 17, 2022Inventors: Kazuki Yagi, Yu Jimbo, Bryan W. Reed, Ruth Shewmon Bloom
-
Patent number: 10018824Abstract: Methods and systems for temporal compressive sensing are disclosed, where within each of one or more sensor array data acquisition periods, one or more sensor array measurement datasets comprising distinct linear combinations of time slice data are acquired, and where mathematical reconstruction allows for calculation of accurate representations of the individual time slice datasets.Type: GrantFiled: November 3, 2017Date of Patent: July 10, 2018Assignee: INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.Inventor: Bryan W. Reed
-
Publication number: 20180136449Abstract: Methods and systems for temporal compressive sensing are disclosed, where within each of one or more sensor array data acquisition periods, one or more sensor array measurement datasets comprising distinct linear combinations of time slice data are acquired, and where mathematical reconstruction allows for calculation of accurate representations of the individual time slice datasets.Type: ApplicationFiled: November 3, 2017Publication date: May 17, 2018Inventor: Bryan W. Reed
-
Patent number: 9841592Abstract: Methods and systems for temporal compressive sensing are disclosed, where within each of one or more sensor array data acquisition periods, one or more sensor array measurement datasets comprising distinct linear combinations of time slice data are acquired, and where mathematical reconstruction allows for calculation of accurate representations of the individual time slice datasets.Type: GrantFiled: August 22, 2016Date of Patent: December 12, 2017Assignee: INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.Inventor: Bryan W. Reed
-
Publication number: 20170146787Abstract: Methods and systems for temporal compressive sensing are disclosed, where within each of one or more sensor array data acquisition periods, one or more sensor array measurement datasets comprising distinct linear combinations of time slice data are acquired, and where mathematical reconstruction allows for calculation of accurate representations of the individual time slice datasets.Type: ApplicationFiled: August 22, 2016Publication date: May 25, 2017Inventor: Bryan W. Reed
-
Patent number: 9373479Abstract: An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system (“laser”). The laser produces a train of temporally-shaped laser pulses of a predefined pulse duration and waveform, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has two pairs of plates arranged perpendicular to one another. A control system controls the laser and a plurality of switching components synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to be provided with an independently set duration and independently set inter-pulse spacings.Type: GrantFiled: September 11, 2015Date of Patent: June 21, 2016Assignee: Lawrence Livermore National Security, LLCInventors: Bryan W. Reed, William J. Dehope, Glenn Huete, Thomas B. LaGrange, Richard M. Shuttlesworth
-
Patent number: 9269527Abstract: An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system (“laser”). The laser produces a train of temporally-shaped laser pulses each being of a programmable pulse duration, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has a plurality of plates. A control system having a digital sequencer controls the laser and a plurality of switching components, synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to enable programmable pulse durations and programmable inter-pulse spacings.Type: GrantFiled: February 14, 2014Date of Patent: February 23, 2016Assignee: Lawrence Livermore National Security, LLCInventors: Bryan W. Reed, William J. DeHope, Glenn Huete, Thomas B. LaGrange, Richard M. Shuttlesworth
-
Publication number: 20160005567Abstract: An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system (“laser”). The laser produces a train of temporally-shaped laser pulses of a predefined pulse duration and waveform, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has two pairs of plates arranged perpendicular to one another. A control system controls the laser and a plurality of switching components synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to be provided with an independently set duration and independently set inter-pulse spacings.Type: ApplicationFiled: September 11, 2015Publication date: January 7, 2016Inventors: Bryan W. REED, William J. DEHOPE, Glenn HUETE, Thomas B. LAGRANGE, Richard M. SHUTTLESWORTH
-
Publication number: 20150332888Abstract: An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system (“laser”). The laser produces a train of temporally-shaped laser pulses each being of a programmable pulse duration, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has a plurality of plates. A control system having a digital sequencer controls the laser and a plurality of switching components, synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to enable programmable pulse durations and programmable inter-pulse spacings.Type: ApplicationFiled: February 14, 2014Publication date: November 19, 2015Applicant: Lawrence Livermore National Security, LLCInventors: Bryan W. REED, William J. DEHOPE, Glenn HUETE, Thomas B. LAGRANGE, Richard M. SHUTTLESWORTH
-
Patent number: 9165743Abstract: An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system (“laser”). The laser produces a train of temporally-shaped laser pulses of a predefined pulse duration and waveform, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has two pairs of plates arranged perpendicular to one another. A control system controls the laser and a plurality of switching components synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to be provided with an independently set duration and independently set inter-pulse spacings.Type: GrantFiled: February 14, 2014Date of Patent: October 20, 2015Assignee: Lawrence Livermore National Security, LLCInventors: Bryan W. Reed, William J. DeHope, Glenn Huete, Thomas B. LaGrange, Richard M. Shuttlesworth
-
Publication number: 20150235800Abstract: An electron microscope is disclosed which has a laser-driven photocathode and an arbitrary waveform generator (AWG) laser system (“laser”). The laser produces a train of temporally-shaped laser pulses of a predefined pulse duration and waveform, and directs the laser pulses to the laser-driven photocathode to produce a train of electron pulses. An image sensor is used along with a deflector subsystem. The deflector subsystem is arranged downstream of the target but upstream of the image sensor, and has two pairs of plates arranged perpendicular to one another. A control system controls the laser and a plurality of switching components synchronized with the laser, to independently control excitation of each one of the deflector plates. This allows each electron pulse to be directed to a different portion of the image sensor, as well as to be provided with an independently set duration and independently set inter-pulse spacings.Type: ApplicationFiled: February 14, 2014Publication date: August 20, 2015Inventors: Bryan W. REED, William J. DEHOPE, Glenn HUETE, Thomas B. LAGRANGE, Richard M. SHUTTLESWORTH
-
Patent number: 8933401Abstract: A scanning transmission electron microscopy (STEM) system is disclosed. The system may make use of an electron beam scanning system configured to generate a plurality of electron beam scans over substantially an entire sample, with each scan varying in electron-illumination intensity over a course of the scan. A signal acquisition system may be used for obtaining at least one of an image, a diffraction pattern, or a spectrum from the scans, the image, diffraction pattern, or spectrum representing only information from at least one of a select subplurality or linear combination of all pixel locations comprising the image. A dataset may be produced from the information. A subsystem may be used for mathematically analyzing the dataset to predict actual information that would have been produced by each pixel location of the image.Type: GrantFiled: October 25, 2013Date of Patent: January 13, 2015Assignee: Lawrence Livermore National Security, LLCInventor: Bryan W. Reed
-
Patent number: 8217352Abstract: A ponderomotive phase plate system and method for controllably producing highly tunable phase contrast transfer functions in a transmission electron microscope (TEM) for high resolution and biological phase contrast imaging. The system and method includes a laser source and a beam transport system to produce a focused laser crossover as a phase plate, so that a ponderomotive potential of the focused laser crossover produces a scattering-angle-dependent phase shift in the electrons of the post-sample electron beam corresponding to a desired phase contrast transfer function.Type: GrantFiled: September 13, 2010Date of Patent: July 10, 2012Assignee: Lawrence Livermore National Security, LLCInventor: Bryan W. Reed
-
Publication number: 20110220791Abstract: A ponderomotive phase plate system and method for controllably producing highly tunable phase contrast transfer functions in a transmission electron microscope (TEM) for high resolution and biological phase contrast imaging. The system and method includes a laser source and a beam transport system to produce a focused laser crossover as a phase plate, so that a ponderomotive potential of the focused laser crossover produces a scattering-angle-dependent phase shift in the electrons of the post-sample electron beam corresponding to a desired phase contrast transfer function.Type: ApplicationFiled: September 13, 2010Publication date: September 15, 2011Inventor: Bryan W. Reed
-
Publication number: 20110168888Abstract: A dynamic transmission electron microscope (DTEM) according to one embodiment includes an electron gun positioned at a top of a column for emitting electrons; an accelerator for accelerating the electrons; a C0 lens positioned below the accelerator for focusing greater than about 95% of the electrons exiting the accelerator; a drift space positioned below the C0 lens; a condenser lens system positioned below the drift space; and a camera chamber positioned below the condenser lens system, the camera chamber for housing a single electron sensitive camera. Additional systems and methods are also presented.Type: ApplicationFiled: January 10, 2011Publication date: July 14, 2011Applicant: Lawrence Livermore National Security, LLCInventors: Bryan W. Reed, Richard M. Shuttlesworth, Thomas B. Lagrange, David J. Gibson
-
Patent number: 6342430Abstract: An isolation process which enhances the performance of silicon micromechanical devices incorporates dielectric isolation segments within the silicon microstructure, which is otherwise composed of an interconnected grid of cantilevered beams. A metal layer on top of the beams provides interconnects and also allows contact to the silicon beams, electrically activating the device for motion or transduction. Multiple conduction paths are incorporated through a metal patterning step prior to structure definition. The invention improves manufacturability of previous processes by performing all lithographic patterning steps on flat topographies, and removing complicated metal sputtering steps required of most high aspect ratio processes. With little modification, the invention can be implemented with in grated circuit fabrication sequences for fully integrated devices.Type: GrantFiled: April 13, 2000Date of Patent: January 29, 2002Assignees: Kionix, Inc., Cornell Research FoundationInventors: Scott G. Adams, Kevin A. Shaw, Russell Y. Webb, Bryan W. Reed, Noel C. MacDonald, Timothy J. Davis
-
Patent number: 6239473Abstract: An isolation process which enhances the performance of silicon micromechanical devices incorporates dielectric isolation segments within the silicon microstructure, which is otherwise composed of an interconnected grid of cantilevered beams. A metal layer on top of the beams provides interconnects and also allows contact to the silicon beams, electrically activating the device for motion or transduction. Multiple conduction paths are incorporated through a metal patterning step prior to structure definition. The invention improves manufacturability of previous processes by performing all lithographic patterning steps on flat topographies, and removing complicated metal sputtering steps required of most high aspect ratio processes. With little modification, the invention can be implemented with integrated circuit fabrication sequences for fully integrated devices.Type: GrantFiled: January 14, 1999Date of Patent: May 29, 2001Assignees: Kionix, Inc., Cornell Research Foundation Inc.Inventors: Scott G. Adams, Kevin A. Shaw, Russell Y. Webb, Bryan W. Reed, Noel C. MacDonald, Timothy J. Davis