Patents by Inventor Bryce Hendrix

Bryce Hendrix has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for requesting trace data reports from FDC semiconductor fabrication processes
    Patent number: 6871112
    Abstract: The invention is, in its various aspects, a method and apparatus for dynamically generating trace data reports in a semiconductor fabrication process employing fault detection control. The method comprises specifying data including at least one of a parameter, a trigger, and a frequency, for a trace data report; automatically generating from a fault detection controller a request including the specified data to a report generator; formulating the trace data report responsive to the request; and returning the formulated trace data report from the report generator based on the request.
    Type: Grant
    Filed: January 7, 2000
    Date of Patent: March 22, 2005
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Elfido Coss, Jr., Michael R. Conboy, Bryce A. Hendrix
  • Method and apparatus for using latency time as a run-to-run control parameter
    Patent number: 6571371
    Abstract: The present invention provides for a method and an apparatus for using a latency time period as a control input parameter. A manufacturing run of semiconductor devices is processed. Metrology data from the processed semiconductor devices is acquired. A latency analysis process is performed using the acquired metrology data. A feedback/feed-forward modification process is performed in response to the latency analysis process.
    Type: Grant
    Filed: December 27, 2000
    Date of Patent: May 27, 2003
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Elfido Coss, Jr., Michael R. Conboy, Bryce Hendrix