Abstract: An example test system includes power amplifier circuitry to force voltage or current to a test channel and one or more processing devices configured to control the power amplifier circuitry to comply with a compliance curve. The compliance curve relates output of the voltage to output of the current. According to the compliance curve, maximum current output increases as an absolute value of the voltage output increases.

Abstract: An example test system includes an output stage to source at least one of voltage or current to a channel of a test instrument; a tracking circuit to detect a channel voltage following the output stage and to control a supply voltage to the output stage based on the channel voltage; and a controller to determine a power dissipation of the output stage based on the supply voltage and the channel voltage, and to control the output stage based on the power dissipation in the output stage.

Abstract: An example method of stabilizing a voltage at a device under test (DUT) includes identifying one or more characteristics of a deviation in a first voltage to appear at the DUT. The deviation may result from a digital signal and a concomitant transient current in the DUT. The digital signal may be part of a test flow to be sent over one or more test channels of automatic test equipment (ATE) to the DUT. The one or more characteristics may be identified prior to sending the test flow to the DUT. The method also includes generating a second voltage to apply to the DUT. The second voltage may be based on the one or more characteristics and being shaped to reduce the deviation.

Abstract: An example method of stabilizing a voltage at a device under test (DUT) includes identifying one or more characteristics of a deviation in a first voltage to appear at the DUT. The deviation may result from a digital signal and a concomitant transient current in the DUT. The digital signal may be part of a test flow to be sent over one or more test channels of automatic test equipment (ATE) to the DUT. The one or more characteristics may be identified prior to sending the test flow to the DUT. The method also includes generating a second voltage to apply to the DUT. The second voltage may be based on the one or more characteristics and being shaped to reduce the deviation.

Abstract: An example test system includes an output stage to source at least one of voltage or current to a channel of a test instrument; a tracking circuit to detect a channel voltage following the output stage and to control a supply voltage to the output stage based on the channel voltage; and a controller to determine a power dissipation of the output stage based on the supply voltage and the channel voltage, and to control the output stage based on the power dissipation in the output stage.

Abstract: An example test system includes power amplifier circuitry to force voltage or current to a test channel and one or more processing devices configured to control the power amplifier circuitry to comply with a compliance curve. The compliance curve relates output of the voltage to output of the current. According to the compliance curve, maximum current output increases as an absolute value of the voltage output increases.