Abstract: A magnetic recording medium such as a magnetic disk includes a NiP or ceramic glass substrate on which a seedlayer is sputtered in a low pressure inert gas atmosphere, the seedlayer comprising a ternary or quaternary alloy formed from a B2 lattice type alloy such as NiAl, CoTi, CoAl, NiTi, FeTi, CoFe, CoHf, CuZn, CoZr, and MnAl. For quaternary alloys in which elements X and Y are added to the B2 type alloy, X can be chosen from one or more elements selected from the group consisting of Co, Ni, Fe, Cu, V, Mn, and Zn, and Y can be chosen from one or more elements selected from the group consisting of Al, Nb, Ta, Hf, Zr, Zn, Ag, Au, Pt and Pd. The resulting seedlayer preferably has an A2 lattice structure.

Abstract: The coercivity of a magnetic recording medium such as a magnetic disk is determined by providing at least two magnetic layers in the recording medium with the relative thicknesses of the two magnetic layers determining coercivity without the need for changing substrate temperature, underlayer thickness or substrate biasing during manufacture. Each magnetic layer is a cobalt alloy of different composition and intrinsic magnetic properties. Importantly, the coercivity can be modified without adversely affecting remanence or squareness of the hysteresis transition region for the recording medium.

Abstract: An underlayer (8A) of a magnetic recording medium (16) includes first and second non-magnetic, chromium-based layers (18, 20), at least one of the first and second chromium-based layers being a chromium alloy. The lattice parameter of the composite underlayer is between the lattice parameters of the first and second chromium-based layers. Recognizing this permits one to predictably adjust the lattice parameter of the composite underlayer to be close to the lattice parameter of the magnetic layer (10) so to optimize magnetic and parametric properties.

Abstract: An underlayer (8A) of a magnetic recording medium (16) includes first and second non-magnetic, chromium-based layers (18, 20), at least one of the first and second chromium-based layers being a chromium alloy. The lattice parameter of the composite underlayer is between the lattice parameters of the first and second chromium-based layers. Recognizing this permits one to predictably adjust the lattice parameter of the composite underlayer to be close to the lattice parameter of the magnetic layer (10) so to optimize magnetic and parametric properties.

Abstract: An underlayer (8A) of a magnetic recording medium (16) includes first and second non-magnetic, chromium-based layers (18, 20), at least one of the first and second chromium-based layers being a chromium alloy. The lattice parameter of the composite underlayer is between the lattice parameters of the first and second chromium-based layers. Recognizing this permits one to predictably adjust the lattice parameter of the composite underlayer to be close to the lattice parameter of the magnetic layer (10) so to optimize magnetic and parametric properties.

Abstract: A magnetic recording medium in which a seedlayer includes an aluminum-containing intermetallic nitride for improved performance.

Abstract: A magnetic recording medium such as a magnetic disk comprises a substrate of NiP or ceramic glass on which is sputtered an underlayer of TiAl or other alloy which has a L10 structure or a disordered fcc structure. A magnetic layer of a cobalt alloy is then sputtered on the underlayer with the magnetic layer having a magnetization which is perpendicular to the layer. A carbon overcoat can be sputtered on the cobalt alloy magnetic layer with a lubricant layer deposited on the carbon overcoat.

Abstract: In a magnetic recording medium such as a magnetic disk which has a multilayer structure including a supporting substrate, at least one underlayer supported by the substrate, and a magnetic layer overlying the underlayer, magnetic and parametric performance of the recording layer is enhanced by providing an underlayer comprising a chromium-aluminum ternary alloy (Cr—Al—X). The aluminum in the Cr—Al—X alloy is 0.5%-4.0% by atomic weight. A second underlayer of chromium or chrome alloy can be provided under the first underlayer in a multilayer structure.