Patents by Inventor Burton A. Devolk

Burton A. Devolk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7114366
    Abstract: A system for acquiring environmental information measurements. The 5 system (100) utilize a sensor, (205) a front-end circuit, (310) a loop filter (315), a switch controller (206), and a reduced-order loop control circuit to provide reliable data measurements while providing robust system behavior. The system further includes a sensor simulator (330) for simulating the operation of the sensor (205) and testing the operation of the front-end circuit (310) and the loop filter (315).
    Type: Grant
    Filed: March 16, 2000
    Date of Patent: October 3, 2006
    Assignee: Input / Output Inc.
    Inventors: Ben Jones, Scott T. Dupuie, Jeffrey Allen Blackburn, Richard A. Johnson, Michael L. Abrams, James Broseghini, Mauricio A. Zavaleta, Mark E. Burchfield, Roger Maher, Burton A. Devolk, Frank Mayo
  • Patent number: 6035694
    Abstract: A method and apparatus for measuring and compensating for stray capacitance of a micro-machined sensor of an accelerometer system is disclosed. Stray capacitance differences between a top plate and a sensing element and between a bottom plate and the sensing element degrade accelerometer performance if not compensated for. Measurement of stray capacitance difference is achieved by operating the accelerometer in two calibration phases and measuring the steady-state output voltage in each of the two phases. In calibration phase 1, no force is applied to the sensor during clock intervals 1-4. In calibration phase 2, a dummy force up is applied and then a dummy force down is applied during those intervals 1-4. The difference in the output voltage of the two calibration phases is representative of the difference in stray capacitance of the sensor. Capacitance is added to the top or bottom plates in an amount proportional to the measured stray capacitance.
    Type: Grant
    Filed: March 12, 1999
    Date of Patent: March 14, 2000
    Assignee: I/O of Austin, Inc.
    Inventors: Scott T. Dupuie, Richard A. Johnson, Ben W. Jones, Mauricio A. Zavaleta, Mark E. Burchfield, Burton A. Devolk, Franklin W. Mayo, Michael L. Abrams, Roger Maher
  • Patent number: 5852242
    Abstract: Apparatus for measuring a characteristic of motion and methods for its manufacture are disclosed in which a sensor structure includes a support structure, and a mass suspended from such support structure by a spring connecting arrangement and electrical devices for measuring displacement of the mass which results from a force applied to the support structure. An apparatus is provided where the mechanical spring constant of the connecting arrangement of the sensor structure is provided to be a high value representative of a strong, stiff spring which resists breaking due to high forces applied to it, and where an electric spring constant is provided to yield a small effective sensor spring constant K.sub.eff =K.sub.m -K.sub.e. Methods are also provided to manufacturing the apparatus by specifying the mechanical spring constant and providing an electric spring constant which will yield a desired effective spring constant which produces a desired characteristic of the sensor structure.
    Type: Grant
    Filed: December 4, 1995
    Date of Patent: December 22, 1998
    Assignee: I/O Sensors, Inc.
    Inventors: Burton A. Devolk, Matthew W. Ip, Bing F. Fung, Franklin W. Mayo, Raymond K. Erickson