Abstract: A microscope-projector system is employed to image and view a transition of light and dark areas on an object. The position of the shadow corresponds to the vertical position of a portion of the object, and an adjustable device is employed for adjusting the position of the microscope-projector with respect to the object. A video camera may be connected to the microscope, to project the image on a monitor. Vertical adjustment of the microscope-projector assembly enables measurement of thickness, for example, with respect to a reference level. The scan lines of the video camera may also be employed to locate the position of the shadow to indicate the thickness of the object, and also to automatically readjust the position of the shadow to a reference level. Electronic circuitry may also play a part to determine from transition in scan lines the horizontal dimensions of an object.