Abstract: The present disclosure relates to a method and system for managing dormant assets based on machine learning. The method for managing dormant assets based on machine learning comprises performing a similarity search for past history of the assets based on the machine learning, determining a reference date for extracting a similar chart depending on a result of the similarity search and extracting the similar chart depending on the determined reference date and generating an expected chart model based on the similar chart. Using the method, it is possible to provide customized dormant asset management services similar to the existing WRAP accounts at low cost.

Abstract: A data storage device includes a non-volatile memory device, which includes a memory cell array including a plurality of memory cells and a control circuit. Each of the memory cells includes a channel layer, a charge trap layer on the channel layer, and a control electrode on the charge trap layer, the charge trap layer being shared by the memory cells. The charge trap layer includes program regions respectively disposed below the control electrodes of the memory cells, and charge spread blocking regions, each of which is disposed between two adjacent ones of the program regions and between two adjacent ones of the control electrodes. The control circuit controls the memory cell array so that a potential barrier is generated in the charge spread blocking regions by charging the charge spread blocking regions with charges having the same polarity as that of program charges stored in the program regions.

Abstract: A method of operating a semiconductor memory device including a plurality of cell strings coupled to dummy word lines and normal word lines includes performing a first sub-program operation on selected normal memory cells by sequentially applying first program pulses to a selected normal word line and performing a second sub-program operation on the selected normal memory cells by sequentially applying second program pulses greater than the first program pulses to the selected normal word line, wherein at least one of the dummy word lines is biased in a same manner as the selected normal word line whenever each of the first program pulses is applied to the selected normal word line.

Abstract: A method of operating a semiconductor memory device including a plurality of cell strings coupled to dummy word lines and normal word lines includes performing a first sub-program operation on selected normal memory cells by sequentially applying first program pulses to a selected normal word line and performing a second sub-program operation on the selected normal memory cells by sequentially applying second program pulses greater than the first program pulses to the selected normal word line, wherein at least one of the dummy word lines is biased in a same manner as the selected normal word line whenever each of the first program pulses is applied to the selected normal word line.

Abstract: A data storage device includes a non-volatile memory device, which includes a memory cell array including a plurality of memory cells and a control circuit. Each of the memory cells includes a channel layer, a charge trap layer on the channel layer, and a control electrode on the charge trap layer, the charge trap layer being shared by the memory cells. The charge trap layer includes program regions respectively disposed below the control electrodes of the memory cells, and charge spread blocking regions, each of which is disposed between two adjacent ones of the program regions and between two adjacent ones of the control electrodes. The control circuit controls the memory cell array so that a potential barrier is generated in the charge spread blocking regions by charging the charge spread blocking regions with charges having the same polarity as that of program charges stored in the program regions.

Abstract: A semiconductor memory device is operated by, inter alia, selecting an even bit line or an odd bit line in response to a read command, and precharging the selected bit line by applying a precharge voltage to the selected bit line; changing potential of the selected bit line in response to a threshold voltage of a selected memory cell coupled to the selected bit line; precharging a non-selected bit line by applying a precharge voltage to the non-selected bit line; and sensing read data in accordance with the potential of the selected bit line.

Abstract: A semiconductor memory device is operated by, inter alia, selecting an even bit line or an odd bit line in response to a read command, and precharging the selected bit line by applying a precharge voltage to the selected bit line; changing potential of the selected bit line in response to a threshold voltage of a selected memory cell coupled to the selected bit line; precharging a non-selected bit line by applying a precharge voltage to the non-selected bit line; and sensing read data in accordance with the potential of the selected bit line.

Abstract: A nonvolatile memory device and a method of manufacturing the same are provided. The nonvolatile memory device which is convertible among a high current state, an intermediate current state, and a low current state, said device includes upper and lower conductive layers; a conductive organic layer comprising a conductive organic polymer and which is formed between the upper and lower conductive layers and has a bistable conduction property; and nanocrystals are formed in the conductive organic layer. The conductive organic polymer may be poly-N-vinylcarbazole (PVK) or polystyrene (PS). The method is characterized in that a conductive organic layer is formed by applying a conductive organic material such as PVK or PS using spin coating. Therefore, it is possible to provide a highly-integrated memory device that consumes less power and provides high operating speed. In addition, it is possible to provide the thermal stability of a memory device by using a conductive organic polymer.

Abstract: The method of manufacturing a nonvolatile memory device includes forming a lower conductive layer on a substrate; forming a first conductive organic layer on the substrate using spin coating; forming a metal layer for forming nanocrystals on the first conductive organic layer, the metal layer partially overlapping the first conductive organic layer; forming a second conductive organic layer on the first conductive organic layer using spin coating; transforming the metal layer into nanocrystals by curing; and forming an upper conductive layer on the second conductive organic layer, the upper conductive layer partially overlapping the nanocrystals. The conductive organic polymer may be poly-N-vinylcarbazole (PVK) or polystyrene (PS).