Abstract: An integrated circuit includes a sampling control circuit configured to generate a sampling enable signal by dividing a sampling period into a plurality of sub-sections according to an active counting signal generated by counting a number of inputs of an active signal during the sampling period, and comparing the active counting signal with a random signal for each sub-section; and a sampling circuit configured to sample and store an input address according to the sampling enable signal.

Abstract: An integrated circuit includes: first and second pattern generation circuits generating first and second pattern signal for a sampling section; a first section control part generating a coarse section signal for a first section of the sampling section, according to the first pattern signal; a first filter part generating a first section extract signal by filtering the second pattern signal according to the coarse section signal; a second section control part generating a fine section signal for a second section of the sampling section, according to the first section extract signal; a second filter part generating a second section extract signal by filtering the second pattern signal according to the fine section signal; an output control circuit generating a sampling enable signal according to the first and second section extract signals; and a sampling circuit suitable for sampling an input signal according to the sampling enable signal.

Abstract: A memory device may include: a memory bank comprising a plurality of memory blocks, each divided into a normal area and a row hammer area, a command control circuit suitable for performing an access operation on the normal area in response to an active command, an internal command generation circuit suitable for generating an internal command in response to a precharge command, a target address generation circuit suitable for saving a count for each logic level combination of a received address in the row hammer area by performing an access operation on the row hammer area in response to the internal command, and setting an address corresponding to the count as a target address when the count satisfies a preset condition, and a refresh control circuit suitable for controlling a smart refresh operation on the target address.

Abstract: A memory device includes: a rate control circuit configured to: generate a refresh counting value based on a refresh management command and an internal target refresh command, and generate a rate control signal by comparing the refresh counting value with a target value corresponding to temperature information; and a target command issuing circuit configured to: set a target number according to the rate control signal, and issue the internal target refresh command whenever a number of inputs of a normal refresh command reaches the target number.

Abstract: An integrated circuit includes: first and second pattern generation circuits generating first and second pattern signal for a sampling section; a first section control part generating a coarse section signal for a first section of the sampling section, according to the first pattern signal; a first filter part generating a first section extract signal by filtering the second pattern signal according to the coarse section signal; a second section control part generating a fine section signal for a second section of the sampling section, according to the first section extract signal; a second filter part generating a second section extract signal by filtering the second pattern signal according to the fine section signal; an output control circuit generating a sampling enable signal according to the first and second section extract signals; and a sampling circuit suitable for sampling an input signal according to the sampling enable signal.

Abstract: A memory device may include: a memory bank comprising a first cell mat used as a normal area and a second cell mat used as a row hammer area and a redundancy area; a target address generation circuit suitable for: saving, in the row hammer area, a count of a received address for an active operation on the memory bank by performing an internal access operation on the row hammer area during the active operation, and setting, a particular count which satisfies a preset condition, an address corresponding to the particular count as a target address; a refresh control circuit suitable for controlling a smart refresh operation on the target address; and a column repair circuit suitable for repairing, when a bit line of the normal area has a defect, the bit line of the normal area with a bit line of the redundancy area.

Abstract: An integrated circuit includes a sampling control circuit configured to generate a sampling enable signal by dividing a sampling period into a plurality of sub-sections according to an active counting signal generated by counting a number of inputs of an active signal during the sampling period, and comparing the active counting signal with a random signal for each sub-section; and a sampling circuit configured to sample and store an input address according to the sampling enable signal.

Abstract: An integrated circuit includes: first and second pattern generation circuits generating first and second pattern signal for a sampling section; a first section control part generating a coarse section signal for a first section of the sampling section, according to the first pattern signal; a first filter part generating a first section extract signal by filtering the second pattern signal according to the coarse section signal; a second section control part generating a fine section signal for a second section of the sampling section, according to the first section extract signal; a second filter part generating a second section extract signal by filtering the second pattern signal according to the fine section signal; an output control circuit generating a sampling enable signal according to the first and second section extract signals; and a sampling circuit suitable for sampling an input signal according to the sampling enable signal.

Abstract: An integrated circuit includes: first and second pattern generation circuits generating first and second pattern signal for a sampling section; a first section control part generating a coarse section signal for a first section of the sampling section, according to the first pattern signal; a first filter part generating a first section extract signal by filtering the second pattern signal according to the coarse section signal; a second section control part generating a fine section signal for a second section of the sampling section, according to the first section extract signal; a second filter part generating a second section extract signal by filtering the second pattern signal according to the fine section signal; an output control circuit generating a sampling enable signal according to the first and second section extract signals; and a sampling circuit suitable for sampling an input signal according to the sampling enable signal.

Abstract: A memory device may include: a memory bank comprising a plurality of memory blocks, each divided into a normal area and a row hammer area, a command control circuit suitable for performing an access operation on the normal area in response to an active command, an internal command generation circuit suitable for generating an internal command in response to a precharge command, a target address generation circuit suitable for saving a count for each logic level combination of a received address in the row hammer area by performing an access operation on the row hammer area in response to the internal command, and setting an address corresponding to the count as a target address when the count satisfies a preset condition, and a refresh control circuit suitable for controlling a smart refresh operation on the target address.

Abstract: A memory device may include: a memory bank comprising a first cell mat used as a normal area and a second cell mat used as a row hammer area and a redundancy area; a target address generation circuit suitable for: saving, in the row hammer area, a count of a received address for an active operation on the memory bank by performing an internal access operation on the row hammer area during the active operation, and setting, a particular count which satisfies a preset condition, an address corresponding to the particular count as a target address; a refresh control circuit suitable for controlling a smart refresh operation on the target address; and a column repair circuit suitable for repairing, when a bit line of the normal area has a defect, the bit line of the normal area with a bit line of the redundancy area.