Patents by Inventor Byong H. Oh

Byong H. Oh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11957065
    Abstract: Various techniques and apparatus permit fabrication of superconductive circuits. A superconducting integrated circuit comprising a superconducting stud via, a kinetic inductor, and a capacitor may be formed. Forming a superconducting stud via in a superconducting integrated circuit may include masking with a hard mask and masking with a soft mask. Forming a superconducting stud via in a superconducting integrated circuit may include depositing a dielectric etch stop layer. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by an electrical vernier. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by a chain of electrical verniers and a Wheatstone bridge. A superconducting integrated circuit with three or more metal layers may include an enclosed, matched, on-chip transmission line. A metal wiring layer in a superconducting integrated circuit may be encapsulated.
    Type: Grant
    Filed: May 17, 2021
    Date of Patent: April 9, 2024
    Assignee: 1372934 B.C. LTD.
    Inventors: Shuiyuan Huang, Byong H. Oh, Douglas P. Stadtler, Edward G. Sterpka, Paul I. Bunyk, Jed D. Whittaker, Fabio Altomare, Richard G. Harris, Colin C. Enderud, Loren J. Swenson, Nicolas C. Ladizinsky, Jason J. Yao, Eric G. Ladizinsky
  • Publication number: 20210384406
    Abstract: Various techniques and apparatus permit fabrication of superconductive circuits. A superconducting integrated circuit comprising a superconducting stud via, a kinetic inductor, and a capacitor may be formed. Forming a superconducting stud via in a superconducting integrated circuit may include masking with a hard mask and masking with a soft mask. Forming a superconducting stud via in a superconducting integrated circuit may include depositing a dielectric etch stop layer. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by an electrical vernier. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by a chain of electrical verniers and a Wheatstone bridge. A superconducting integrated circuit with three or more metal layers may include an enclosed, matched, on-chip transmission line. A metal wiring layer in a superconducting integrated circuit may be encapsulated.
    Type: Application
    Filed: May 17, 2021
    Publication date: December 9, 2021
    Inventors: Shuiyuan Huang, Byong H. Oh, Douglas P. Stadtler, Edward G. Sterpka, Paul I. Bunyk, Jed D. Whittaker, Fabio Altomare, Richard G. Harris, Colin C. Enderud, Loren J. Swenson, Nicolas C. Ladizinsky, Jason J. Yao, Eric G. Ladizinsky
  • Patent number: 11038095
    Abstract: Various techniques and apparatus permit fabrication of superconductive circuits. A superconducting integrated circuit comprising a superconducting stud via, a kinetic inductor, and a capacitor may be formed. Forming a superconducting stud via in a superconducting integrated circuit may include masking with a hard mask and masking with a soft mask. Forming a superconducting stud via in a superconducting integrated circuit may include depositing a dielectric etch stop layer. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by an electrical vernier. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by a chain of electrical verniers and a Wheatstone bridge. A superconducting integrated circuit with three or more metal layers may include an enclosed, matched, on-chip transmission line. A metal wiring layer in a superconducting integrated circuit may be encapsulated.
    Type: Grant
    Filed: January 31, 2018
    Date of Patent: June 15, 2021
    Assignee: D-WAVE SYSTEMS INC.
    Inventors: Shuiyuan Huang, Byong H. Oh, Douglas P. Stadtler, Edward G. Sterpka, Paul I. Bunyk, Jed D. Whittaker, Fabio Altomare, Richard G. Harris, Colin C. Enderud, Loren J. Swenson, Nicolas C. Ladizinsky, Jason J. Yao, Eric G. Ladizinsky
  • Publication number: 20200144476
    Abstract: Various techniques and apparatus permit fabrication of superconductive circuits. A superconducting integrated circuit comprising a superconducting stud via, a kinetic inductor, and a capacitor may be formed. Forming a superconducting stud via in a superconducting integrated circuit may include masking with a hard mask and masking with a soft mask. Forming a superconducting stud via in a superconducting integrated circuit may include depositing a dielectric etch stop layer. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by an electrical vernier. Interlayer misalignment in the fabrication of a superconducting integrated circuit may be measured by a chain of electrical verniers and a Wheatstone bridge. A superconducting integrated circuit with three or more metal layers may include an enclosed, matched, on-chip transmission line. A metal wiring layer in a superconducting integrated circuit may be encapsulated.
    Type: Application
    Filed: January 31, 2018
    Publication date: May 7, 2020
    Inventors: Shuiyuan Huang, Byong H. Oh, Douglas P. Stadtler, Edward G. Sterpka, Paul I. Bunyk, Jed D. Whittaker, Fabio Altomare, Richard G. Harris, Colin C. Enderud, Loren J. Swenson, Nicolas C. Ladizinsky, Jason J. Yao, Eric G. Ladizinsky