Patents by Inventor Byonghun CHO

Byonghun CHO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of generating quality affecting factor for semiconductor manufacturing process and generating system for the same
    Patent number: 10254333
    Abstract: A quality affecting factor generation method for a semiconductor manufacturing process is provided. The method includes receiving data of a customer evaluation result obtained by a real use of shipped semiconductor products, preprocessing the data of the customer evaluation result, determining critical quality factors that affect a quality of the semiconductor products by applying a statistical model to the preprocessed data of the customer evaluation result; and determining a semiconductor product to be shipped to a customer company as a good product and a failed product using the determined critical quality factors and generating quality affecting factors of the semiconductor products to be managed to improve yield in a semiconductor manufacturing process.
    Type: Grant
    Filed: December 1, 2015
    Date of Patent: April 9, 2019
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: SeungLi Kim, Bokyoung Kang, Ji-Youn Kwon, Gilhan Kim, Chanhun Park, Byonghun Cho, SeHoon Kim
  • METHOD OF GENERATING QUALITY AFFECTING FACTOR FOR SEMICONDUCTOR MANUFACTURING PROCESS AND GENERATING SYSTEM FOR THE SAME
    Publication number: 20160202312
    Abstract: A quality affecting factor generation method for a semiconductor manufacturing process is provided. The method includes receiving data of a customer evaluation result obtained by a real use of shipped semiconductor products, preprocessing the data of the customer evaluation result, determining critical quality factors that affect a quality of the semiconductor products by applying a statistical model to the preprocessed data of the customer evaluation result; and determining a semiconductor product to be shipped to a customer company as a good product and a failed product using the determined critical quality factors and generating quality affecting factors of the semiconductor products to be managed to improve yield in a semiconductor manufacturing process.
    Type: Application
    Filed: December 1, 2015
    Publication date: July 14, 2016
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: SeungLi KIM, Bokyoung KANG, Ji-Youn KWON, Gilhan KIM, Chanhun PARK, Byonghun CHO, SeHoon KIM