Abstract: A test apparatus for a mixed-signal semiconductor device that includes a plurality of event tester modules including analog and digital signal tester boards, a test head for event tester modules, a performance board including a socket for a DUT, a test fixture including a connection means, an option circuit for when the DUT is a mixed-signal integrated circuit including an analog and digital function blocks, a tester controller controlling the overall operation, and a switching parallel connection circuit sequentially connecting a single event tester board with a plurality of the DUTs. The event tester board and the DUTs are connected by a group unit. The number of parallel test is increased by an improved tester board or an improved performance board without the use of an extra event tester board for an analog signal test.

Abstract: A tester including a first module for testing a digital-to-analog conversion and a second module for testing an analog-to-digital conversion. The tester may include a controller for controlling operation of the first and second modules. The tester does not require a system bus, and modules may be swapped, added to the tester and/or removed from the tester based on application specific requirements.

Abstract: A tester including a first module for testing a digital-to-analog conversion and a second module for testing an analog-to-digital conversion. The tester may include a controller for controlling operation of the first and second modules. The tester does not require a system bus, and modules may be swapped, added to the tester and/or removed from the tester based on application specific requirements.

Abstract: A test apparatus for a mixed-signal semiconductor device that includes a plurality of event tester modules including analog and digital signal tester boards, a test head for event tester modules, a performance board including a socket for a DUT, a test fixture including a connection means, an option circuit for when the DUT is a mixed-signal integrated circuit including an analog and digital function blocks, a tester controller controlling the overall operation, and a switching parallel connection circuit sequentially connecting a single event tester board with a plurality of the DUTs. The event tester board and the DUTs are connected by a group unit. The number of parallel test is increased by an improved tester board or an improved performance board without the use of an extra event tester board for an analog signal test.

Abstract: A tester for a mixed signal semiconductor device having a reconstructed digital tester, and a method of testing a semiconductor device using the same are provided. A digital tester electrically tests a digital device and is controlled by a first controller. A metrology instrument module comprising an analog source generator for applying an analog signal to a semiconductor device, an analog waveform digitizer for analyzing the analog signal into a digital signal, and a personal computer including a second controller forms a part of the digital tester, and the first controller is connected to the metrology instrument module through an interface line.

Abstract: A method for verifying correct operation and functional stability of a tester for semiconductor devices is disclosed. In addition, a method for creating a standard device for use with the tester is also disclosed. In creating a standard device according to the present invention, the tester repeatedly tests a candidate device a predefined number of times and evaluates the test results to determine whether the candidate device is suitable for use as a standard device. In verifying the operation and functional stability of a semiconductor device tester, data generated by repeatedly testing a standard device a predefined number of times are compared to recorded reference data of previous tests of the standard device.