Abstract: Disclosed are a non-volatile memory device capable of performing memory operations in parallel and a method for operating the non-volatile memory device, and a system including the non-volatile memory device. A non-volatile memory system may include a memory controller suitable for controlling a memory; and the memory suitable for performing read and program operations in response to commands from the memory controller, and wherein the memory controller and the memory operate in a high interface mode, and operate in a low interface mode when an operation to read internal data or an operation to receive (N+1)th data is performed during an operation to program Nth data in the memory.

Abstract: A control circuit includes a ROM suitable for generating ROM data based on a ROM address corresponding to a predetermined operation, a command analyzing unit suitable for outputting the ROM address corresponding to the predetermined operation, generating an address storing signal in response to an operation suspension command for suspending the predetermined operation, and generating an address output signal in response to an operation resumption command for resuming the predetermined operation, an address storing unit suitable for storing a ROM address, which corresponds to the ROM address at a time point where the predetermined operation is suspended, in response to the address storing signal, and an address output unit suitable for outputting the ROM address corresponding to said time point in response to the address output signal, wherein the ROM generates ROM data for resuming the predetermined operation based on the ROM address corresponding to said time point.

Abstract: A nonvolatile memory includes a memory cell array including a plurality of nonvolatile memory cells connected to bit lines and word lines crossing the bit lines, a voltage driver configured to provide a word line voltage to the word lines and provide a first voltage during a precharging operation and a second voltage during a sensing operation, based on a voltage setting signal, and a page buffer unit configured to adjust a precharging level of a sensing node connected to a bit line of a page included in a selected memory block of the memory cell array using the first voltage and adjust a sensing level of the sensing node using the second voltage.

Abstract: A nonvolatile memory device includes a plurality of global word lines, a voltage pump configured to generate a plurality of voltages, a control unit configured to divide the plurality of global word lines into a first group and a second group in response to an input row address and generate control signals, a first selection unit configured to output at least two different voltages that are to be applied to global word lines of the first group, a second selection unit configured to output a voltage that is to be applied to global word lines of the second group, and a third selection unit configured to apply output voltages of the first selection unit to the global word lines of the first group, and apply an output voltage of the second selection unit to the global word lines of the second group.

Abstract: A semiconductor memory device is kept in a busy state by controlling a ready/busy pad when a detection signal is output since an external voltage is less than a reference voltage, prevents generation of an operating voltage by a pump circuit by preventing generation of a pump clock, and resets a microcontroller by preventing generation of micro clock. Accordingly, the semiconductor memory device may be prevented from malfunctioning through a series of operations when the external voltage is less than the reference voltage.

Abstract: A control circuit includes a ROM suitable for generating ROM data based on a ROM address corresponding to a predetermined operation, a command analyzing unit suitable for outputting the ROM address corresponding to the predetermined operation, generating an address storing signal in response to an operation suspension command for suspending the predetermined operation, and generating an address output signal in response to an operation resumption command for resuming the predetermined operation, an address storing unit suitable for storing a ROM address, which corresponds to the ROM address at a time point where the predetermined operation is suspended, in response to the address storing signal, and an address output unit suitable for outputting the ROM address corresponding to said time point in response to the address output signal, wherein the ROM generates ROM data for resuming the predetermined operation based on the ROM address corresponding to said time point.

Abstract: A semiconductor memory device includes memory cells for storing data, page buffers each configured to comprise a dynamic latch and a static latch on which data to be programmed in to the memory cells or data read from the memory cells are latched, and a control logic configured to store a plurality of refresh mode select codes corresponding to various refresh cycles, and refresh the dynamic latch by exchanging data between the static latch and the dynamic latch according to a refresh cycle corresponding to a selected refresh mode select code.

Abstract: An embodiment of the present invention provides a semiconductor device, including cell string comprising a plurality of memory cells; page buffer comprising latch and switching element, wherein the switching element is coupled between the latch and the bit line which is coupled to the cell string; and a page buffer controller configured to apply a gradually rising turn-on voltage to the switching elements during a bit line setup operation of a program operation.

Abstract: Disclosed are a non-volatile memory device capable of performing memory operations in parallel and a method for operating the non-volatile memory device, and a system including the non-volatile memory device. A non-volatile memory system may include a memory controller suitable for controlling a memory; and the memory suitable for performing read and program operations in response to commands from the memory controller, and wherein the memory controller and the memory operate in a high interface mode, and operate in a low interface mode when an operation to read internal data or an operation to receive (N+1)th data is performed during an operation to program Nth data in the memory.

Abstract: A semiconductor memory device may include a cell string configured to include memory cells, a page buffer coupled to the cell string through a bit line, and configured to include a latch for storing data to be programmed in a memory cell or data read from the memory cell, a precharge voltage generation circuit configured to generate a precharge voltage from an external voltage according to the data stored in the latch, bit line precharge circuits configured to supply the precharge voltage to the bit line in response to precharge control signals, and a control circuit configured to output the precharge control signals so that the number of enabled bit line precharge circuits increases, accordingly, as a supply number of a program voltage augments in a program operation.

Abstract: A semiconductor memory device and a method of operating the same results in reduced programming time. The semiconductor memory device includes advanced circuitry that enables reductions in programming and verification times, leading to a substantial reduction in the total time required to program the device.

Abstract: A semiconductor memory device is kept in a busy state by controlling a ready/busy pad when a detection signal is output since an external voltage is less than a reference voltage, prevents generation of an operating voltage by a pump circuit by preventing generation of a pump clock, and resets a microcontroller by preventing generation of micro clock. Accordingly, the semiconductor memory device may be prevented from malfunctioning through a series of operations when the external voltage is less than the reference voltage.

Abstract: A semiconductor device having a test function includes a program counter for storing a breaking address in a storage unit in response to control signals, increasing a count address in response to the control signals, and storing the increased count address in the storage unit; a controller for stopping the increase of the count address when the count address is identical to the breaking address and outputting a pump holding signal; an oscillator for generating a clock signal in response to an enable signal and maintaining a current cycle of the clock signal in response to the pump holding signal; and a pump unit for generating an output voltage in response to the clock signal.

Abstract: A nonvolatile memory device includes a control logic configured to generate an internal command in response to an internal clock, a finite state machine configured to generate a plurality of current state signals in a program pulse and verify pulse setup operation for a program operation and a program verify operation in response to the internal command, after a program operation using a program pulse and a program verify operation using a program verify pulse are completed, and a glue logic configured to generate check control signals for checking a plurality of page buffers of the page buffer unit in response to the plurality of current state signals in the setup operation.

Abstract: A nonvolatile memory includes a memory cell array including a plurality of nonvolatile memory cells connected to bit lines and word lines crossing the bit lines, a voltage driver configured to provide a word line voltage to the word lines and provide a first voltage during a precharging operation and a second voltage during a sensing operation, based on a voltage setting signal, and a page buffer unit configured to adjust a precharging level of a sensing node connected to a bit line of a page included in a selected memory block of the memory cell array using the first voltage and adjust a sensing level of the sensing node using the second voltage.

Abstract: A semiconductor memory device may include a cell string configured to include memory cells, a page buffer coupled to the cell string through a bit line, and configured to include a latch for storing data to be programmed in a memory cell or data read from the memory cell, a precharge voltage generation circuit configured to generate a precharge voltage from an external voltage according to the data stored in the latch, bit line precharge circuits configured to supply the precharge voltage to the bit line in response to precharge control signals, and a control circuit configured to output the precharge control signals so that the number of enabled bit line precharge circuits increases, accordingly, as a supply number of a program voltage augments in a program operation.

Abstract: A data interface unit is used in a semiconductor memory device and includes a data alignment unit configured to separate consecutive input data into rising data and falling data, and a data transfer unit configured to selectively transfer the rising data and falling data to an even column line and an odd column line in response to a start column address.

Abstract: A semiconductor memory device includes a memory cell array including cell strings each including a plurality of memory cells, bit lines coupled to the respective cell strings, and page buffers configured to compare a reference current and currents of the respective bit line and output sense data corresponding to a level of a threshold voltage of a selected memory cell based on a result of the comparison, in a sense operation.

Abstract: A semiconductor memory device and a method of operating the same results in reduced programming time. The semiconductor memory device includes advanced circuitry that enables reductions in programming and verification times, leading to a substantial reduction in the total time required to program the device.

Abstract: A nonvolatile memory device includes a control logic configured to generate an internal command in response to an internal clock, a finite state machine configured to generate a plurality of current state signals in a program pulse and verify pulse setup operation for a program operation and a program verify operation in response to the internal command, after a program operation using a program pulse and a program verify operation using a program verify pulse are completed, and a glue logic configured to generate check control signals for checking a plurality of page buffers of the page buffer unit in response to the plurality of current state signals in the setup operation.