Abstract: A method to enlarge and change an image displayed by a photographing apparatus, and a photographing apparatus using the same. The enlargement method includes adding guide information regarding a zoom-in area and compensating the guide information based on the zoom-in command.

Abstract: A display method and a photographing apparatus and display apparatus using the display method include displaying a photographed image and received images, and changing a mode of one of the images when a display area of one of the images is changed. Therefore, it is possible to view or record one or more images photographed by one or more external photographing apparatuses in real-time.

Abstract: Provided is a method of forming a fine pitch in a flexible printed circuit board (FPCB) having an increased adhesive property of wirings and an improved insulating property between the wirings. The method includes etching regions where wirings are to be formed on a base substrate; forming conductive layers on the etched regions; forming a photoresist film on a substrate between the etched regions; forming the wirings by forming the conductive layers on the etched regions to be higher than the substrate; and removing the photoresist film.

Abstract: Provided is an apparatus for sorting burn-in tested packaged chips, including a DC test unit performing a DC test on packaged chips, a DC failure/loading head moving in a first direction to load packaged chips onto the DC test unit, and an inserting head moving in a second direction perpendicular to the first direction to transfer DC test-passed packaged chips from the DC test unit to a burn-in board, wherein the DC test unit is moved in the second direction, close to the DC failure/loading head when loading the packaged chips onto the DC test unit and close to the inserting head when transferring the packaged chips to the burn-in board, to sort burn-in tested packaged chips. The structure in which the DC test unit is movable toward the DC failure/loading head and the inserting head makes it possible to reduce the distance which the heads have to travel and to prevent the DC failure/loading head and the inserting head from interfering with each other.

Abstract: Provided is an apparatus for sorting burn-in tested packaged chips, including a DC test unit performing a DC test on packaged chips, a DC failure/loading head moving in a first direction to load packaged chips onto the DC test unit, and an inserting head moving in a second direction perpendicular to the first direction to transfer DC test-passed packaged chips from the DC test unit to a burn-in board, wherein the DC test unit is moved in the second direction, close to the DC failure/loading head when loading the packaged chips onto the DC test unit and close to the inserting head when transferring the packaged chips to the burn-in board, to sort burn-in tested packaged chips. The structure in which the DC test unit is movable toward the DC failure/loading head and the inserting head makes it possible to reduce the distance which the heads have to travel and to prevent the DC failure/loading head and the inserting head from interfering with each other.

Abstract: The invention relates to a sink mounting type dish washer, and more particularly, relates to a sink mounting type dish washer which may be conveniently attachable to a conventional sink.

Abstract: Provided are an IC sorter, a method for sorting a burn-in IC, an IC sorted using the method.