Abstract: A measuring apparatus (10) for measuring the thickness of a coating on a workpiece (36) by X-ray fluorescence. The apparatus includes a frame (12) upon which is mounted an X-ray tube (14), a shutter (16), first collimator means (18), and a mirror (20) through which an X-ray beam may be projected. Also mounted on the frame (12) is a signal detector (26), which may be in the form of a proportional counter, a fixed focal length viewing device (28) which is capable of viewing a workpiece through the mirror, and a work holder (34) carried by a work holder mount (32) which is capable of moving the workpiece (36) in x, y and z orientations. The apparatus is further provided with a second collimator means (48) shiftable by a moving apparatus (53) from an inoperative position to an operative position wherein a second collimator (50) is disposed between the mirror and the workpiece in such a manner that the terminal end (51) of the second collimator is as close as possible to the coating on the workpiece.

Abstract: An apparatus for measuring the thickness of a coating on a continuously moving strip of material. The apparatus includes a frame (10), a shuttle (24) mounted on the frame for reciprocal movement thereon, an engaging pin (174) carried by the shuttle and capable of engaging the moving strip to cause the shuttle to be moved by the strip, a drive (120, 122, 118, 126, 116, 114, and 112) capable of moving the shuttle in a direction reverse to the movement of the strip, and measuring means, at least a portion of which is mounted on the shuttle. The apparatus further includes a support (172) mounted on the shuttle and capable of supporting the strip when the engaging pin is engaging the moving strip, and structure capable of adjusting the support (172) towards and away from the portion of the measuring means mounted on the shuttle to establish a predetermined spaced apart measuring distance.

Abstract: Apparatus using radiation techniques for measuring coating thickness on continuously moving strip material as it travels along a predetermined path and without altering that path. A shuttle carrying a measuring probe having a radioactive isotope source and a detection device is provided in the path of the strip for reciprocation along a preselected segment of the path. The shuttle and the probe are releasably engaged with the strip and carried thereby for synchronous movement therewith in the direction of travel of the strip during a measurement cycle, and are disengaged from the strip when no measurement is being made, the movement of the shuttle then being controlled by an independent drive mechanism. The shuttle includes a strip guide plate which is tiltable about an axis substantially parallel to the longitudinal axis of the strip in order to orient the surface having the coating so it can be properly presented to the measuring probe.

Abstract: A device especially adapted for measuring the thickness of coatings on small, complexly-shaped parts, such as, for example, electronic connectors, electronic contacts, or the like. The device includes a source of beta radiation and a radiation detector whereby backscatter of the radiation from the coated part can be detected and the thickness of the coating ascertained. The radiation source and detector are positioned in overlying relationship to the coated part and a microscope is provided to accurately position the device with respect to the part. Means are provided to control the rate of descent of the radiation source and radiation detector from its suspended position to its operating position and the resulting impact it makes with the coated part to thereby promote uniformity of readings from operator to operator, and also to avoid excessive impact with the part, thereby improving accuracy of measurement and eliminating damage to the parts.

Abstract: A portable device for measuring coating thickness incorporating a radioactive isotope source and a detector. The device is capable of being readily moved from place to place to measure the thickness of thin film coatings applied to various types of substrates, and incorporates spring means for bringing the isotope source holder into intimate contact with the area to be measured and for holding it in that position. The device also includes a locating system whereby a cross-hair or other image is projected onto the surface of the coating the thickness of which is to be measured, at the point where the source holder would contact the coating surface, permitting extremely accurate locating of the device with respect to the area being measured to thereby facilitate the measuring operation and to permit it to be done in an accurate, speedy, and efficient manner.