Abstract: A method is provided for importing at least one antenna configuration for a device under test (DUT) into a test and measurement (TM) system. The method is performed by the TM system and comprises the steps of receiving data comprising antenna configuration information related to the DUT, extracting the at least one antenna configuration for the DUT from the antenna configuration information in the data in a digital domain, and storing the extracted antenna configuration into settings of the TM system.

Abstract: A measurement system for determining an energy usage parameter of an electronic device under test is described. The measurement system includes a thermal chamber and an analysis circuit. The thermal chamber includes a housing, a temperature regulator and a thermal control circuit. The housing encloses an interior space of the thermal chamber, wherein the interior space is configured to accommodate the device under test. The thermal control circuit is configured to control the temperature regulator to keep a temperature of the interior space at a predefined reference temperature. The thermal control circuit is configured to determine a power consumption of the temperature regulator, wherein the power consumption is associated with keeping the temperature of the interior space at the predefined reference temperature. The analysis circuit is configured to determine at least one energy usage parameter of the device under test based on the determined power consumption.

Abstract: A method for generating an event log in view of at least one test routine for a device under test, a logging system for logging at least one event frame for a device under test, a method for training a machine learning circuit to extract event frames from multimedia data, and a method for extracting event frames from multimedia data using a machine learning circuit trained are described.

Abstract: This application is related to a measuring system and method for performing various measurement tasks. The measuring system comprises a test-setup configured to measure the characteristics of a device-under-test and an input-device of the test-setup configured to receive a test-case. The measuring system further comprises several measurement-hardware devices configured to perform the measurements according to the test-case. A computer unit of the measuring system is configured to determine at least one required hardware device on the basis of the test-case and to select the additional measurement-hardware devices. The computer unit is further configured to identify an adding of the selected additional measurement-hardware.

Abstract: This application is related to a measuring system and method for performing various measurement tasks. The measuring system comprises a test-setup configured to measure the characteristics of a device-under-test and an input-device of the test-setup configured to receive a test-case. The measuring system further comprises several measurement-hardware devices configured to perform the measurements according to the test-case. A computer unit of the measuring system is configured to determine at least one required hardware device on the basis of the test-case and to select the additional measurement-hardware devices. The computer unit is further configured to identify an adding of the selected additional measurement-hardware.