Patents by Inventor Byung-Il Ryu

Byung-Il Ryu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Circuits and methods for burn-in of integrated circuits using potential differences between adjacent main word lines
    Patent number: 6084808
    Abstract: External address signals are applied to an integrated circuit in a burn-in test mode. The external address signals control the voltage levels of adjacent main word lines in a memory array in the integrated circuit. The adjacent main word lines may thereby be configured in to be in opposing logic states. The opposing logic states may provide a potential difference between the adjacent main word lines, thereby increasing the likelihood of detecting microbridges between the adjacent main word lines formed during fabrication of the integrated circuit. The reliability of the integrated circuit may thereby be improved.
    Type: Grant
    Filed: November 25, 1998
    Date of Patent: July 4, 2000
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jong-Hyoung Lim, Sang-Seok Kang, Jin-Seok Lee, Byung-Il Ryu