Abstract: A semiconductor device includes a plurality of first micro-bumps suitable for transferring normal signals; a plurality of a second micro-bumps suitable for transferring test signals; and a test circuit including a plurality of scan cells respectively corresponding to the first and second micro-bumps. The test circuit is suitable for applying signals stored in the respective scan cells to the first and second micro-bumps, feeding back the applied signals from the first and second micro-bumps to the respective scan cells, and sequentially outputting the signals stored in the scan cells to a test output pad.

Abstract: A semiconductor device includes a plurality of first micro-bumps suitable for transferring normal signals; a plurality of a second micro-bumps suitable for transferring test signals; and a test circuit including a plurality of scan cells respectively corresponding to the first and second micro-bumps. The test circuit is suitable for applying signals stored in the respective scan cells to the first and second micro-bumps, feeding back the applied signals from the first and second micro-bumps to the respective scan cells, and sequentially outputting the signals stored in the scan cells to a test output pad.

Abstract: Disclosed are various exemplary embodiments of a clock recovery apparatus for recovering clock signals of multiple data channels. In one exemplary embodiment a clock recovery apparatus for a plurality of data channels may include a plurality of channel blocks, where each channel block may include a frequency detection block configured to generate an intermediate signal based on a respective data signal received from a respective data channel and a global signal, and a recovery block configured to recover a clock signal for the respective data channel in response to the respective data signal and the global signal. The apparatus may also include a global signal generation block configured to receive and combine the intermediate signals from the plurality of channel blocks to generate the global signal.

Abstract: Disclosed are various exemplary embodiments of a clock recovery apparatus for recovering clock signals of multiple data channels. In one exemplary embodiment a clock recovery apparatus for a plurality of data channels may include a plurality of channel blocks, where each channel block may include a frequency detection block configured to generate an intermediate signal based on a respective data signal received from a respective data channel and a global signal, and a recovery block configured to recover a clock signal for the respective data channel in response to the respective data signal and the global signal. The apparatus may also include a global signal generation block configured to receive and combine the intermediate signals from the plurality of channel blocks to generate the global signal.