Abstract: A method of removing a metal substance in a petrochemical product including: supplying a petrochemical product stream to an incoming tank through a supply pipe, circulating the petrochemical product stream through an incoming tank circulation pipe, and removing a metal substance included in the petrochemical product stream using a magnetic filter; transporting the petrochemical product stream to an outgoing tank through an incoming tank discharge pipe which is branched from the incoming tank circulation pipe and connected to an outgoing tank; circulating the petrochemical product stream through an outgoing tank circulation pipe provided in the outgoing tank and removing the metal substance included in the petrochemical product stream using a magnetic filter; and transporting the petrochemical product stream to a branch pipe branched from the outgoing tank circulation pipe to remove the metal substance using an ion exchange resin filter.

Abstract: An aerosol generating device may include a heater configured to heat an aerosol generating material, a battery configured to supply power to the heater, and a controller. In addition, the aerosol generating device may further include a user input detection sensor configured to receive a user's input and a pressure detection sensor configured to sense pressure. The controller may, in response to the user's input being sensed by using the user input detection sensor, obtain an initial pressure sensing value by using the pressure detection sensor. In addition, the controller may determine a reference pressure value based on the initial pressure sensing value and determine whether a puff of the aerosol generating device has occurred based on the reference pressure value.

Abstract: The present invention relates to a compound represented by Formula 1, a pharmaceutically acceptable salt thereof, or an isomer thereof, and a pharmaceutical composition for treating or preventing proteasome-mediated diseases, comprising the same as an active ingredient.

Abstract: A wafer manufacturing method, an epitaxial wafer manufacturing method, and a wafer and epitaxial wafer manufactured thereby, are provided. The wafer manufacturing method enables the manufacture of a wafer with a low density of micropipe defects and minimum numbers of particles and scratches. The epitaxial wafer manufacturing method enables the manufacture of an epitaxial wafer that has low densities of defects such as downfall, triangular, and carrot defects, exhibits excellent device characteristics, and improves the yield of devices.

Abstract: A color conversion substrate and a display device are provided. The color conversion substrate includes a base substrate, a first color filter and a second color filter disposed on a surface of the base substrate, a first partition layer disposed between the first color filter and the second color filter, a second partition layer disposed on the first partition layer, a first wavelength conversion pattern disposed on the first color filter and a second wavelength conversion pattern disposed on the second color filter, wherein the first partition layer includes a first lower surface disposed on the first color filter and a second lower surface disposed on the second color filter.

Abstract: A wafer manufacturing method, an epitaxial wafer manufacturing method, and a wafer and epitaxial wafer manufactured thereby, are provided. The wafer manufacturing method enables the manufacture of a wafer with a low density of micropipe defects and minimum numbers of particles and scratches. The epitaxial wafer manufacturing method enables the manufacture of an epitaxial wafer that has low densities of defects such as downfall, triangular, and carrot defects, exhibits excellent device characteristics, and improves the yield of devices.

Abstract: A cylindrical secondary battery and a manufacturing method of a secondary battery are provided. A manufacturing method of a cylindrical secondary battery includes: winding an electrode assembly to expose a first electrode uncoated portion and a second electrode uncoated portion to opposite ends in a longitudinal direction; bending at least some portions of the first electrode uncoated portion and the second electrode uncoated portion of the electrode assembly in a direction by pressing the first electrode uncoated portion and the second electrode uncoated portion; welding electrode collector plates to ends of the bent first and second electrode uncoated portions; and inserting and sealing the electrode assembly into a cylindrical case.

Abstract: Disclosed is a uterine manipulator that may automatically adjust a location and a posture of a uterus according to an input of a user. The uterine manipulator according to the inventive concept may allow a motion of a total of four degrees of freedom with a rotation of a 3 degree of freedom of rolling, pitching, and yawing, and a linear movement of one degree of freedom in a forward/rearward direction, and because the tip may be adjusted in a narrow space, surgical preciseness may be enhanced. Furthermore, because the surgical operator may manipulate the uterus through a direct input, a surgical time may be shortened.

Abstract: Disclosed is an apparatus for transferring a substrate. The apparatus includes a transfer robot, a linear rail unit including a movable plate on which the transfer robot is mounted and a running shaft on which the movable plate travels, and a particle diffusion prevention member that prevents diffusion of particles to the outside by maintaining a differential pressure between the movable plate and the running shaft.

Abstract: The present invention relates to a self-diagnostic apparatus capable of improving safety of a device under test (DUT) by analyzing a characteristic change of a DUT, such as a semiconductor, a circuit module, or a system, in a safe operating region over time and allowing a regular test and a periodic test to be performed even while the DUT is running.

Abstract: Provided is a measuring method for testing a device under test (DUT) having a plurality of terminals and, particularly, to a means for measuring the functions and performance of various electronic devices in which an electronic circuit such as that in an electronic device, a semiconductor element, a circuit module, and a circuit board is mounted, and to: a method by which a processor supports measurement with software such that unit costs can be reduced to be lower than those of conventional means operating with various, high-cost hardware; and a device using the same.

Abstract: The present invention relates to a self diagnostic apparatus for an electronic device, which includes a vector memory configured to store a test function code for testing a device under test (DUT) equipped with a plurality of cores which perform arithmetic operations, a function test expected value corresponding to a function test according to the test function code, a design for test (DFT) test code, a DFT test expected value corresponding to a DFT test according to the DFT test code, and a non-test function code for a general arithmetic operation or an operation of the DUT; a test data storage configured to store test data including a DFT test code result value which is a result of the DFT test according to the DFT test code, a test function code result value which is a result of the function test according to the test function code, and a non-test function code result value which is a result of the function test according to the non-test function code; and a safety region test controller configured to sele

Abstract: Provided is a test apparatus for testing a device under test (DUT), the apparatus operating at an operating frequency that is lower than an operating frequency of the DUT. The test apparatus includes a clock source which generates a clock according to the operating frequency of the test apparatus, a clock multiplier configured to multiply the generated clock source by a multiplication number which is set according to the operating frequency of the DUT and output a first clock for the DUT, a phase converter configured to shift a phase of the generated clock according to the multiplication number and output a plurality of second clocks having different phases, and a test pattern comparator configured to sequentially collect pieces of data from the DUT by sequentially applying the plurality of second clocks having different phases.

Abstract: The substrate treating apparatus includes a processing module and an index module on which a cassette having the substrate received therein is placed and that includes an index robot that transfers the substrate between the cassette and the processing module. The processing module includes a process chamber and a transfer chamber. The process chamber includes a support unit. The support unit includes a support on which the substrate is placed and a ring member that surrounds the substrate placed on the support and that is provided so as to be detachable from the support. The apparatus further includes a carrier storage unit that stores a carrier that is mounted on a hand of the main transfer robot or the index robot and on which the ring member is placed when the ring member is transferred by the main transfer robot or the index robot.

Abstract: A current measurement apparatus comprises: a capacitor connected in parallel to a signal terminal of a device under test (DUT); a test pattern generation apparatus generating a test pattern to operate the DUT; and a measurement module connected to one end of the capacitor. The measurement module comprises: an input/output (I/O) buffer increasing or reducing an amount of charges of the capacitor and outputting a signal corresponding to an output logic value according to a voltage of the one end of the capacitor; a time measurer measuring an arrival time which it takes for the voltage of the one end of the capacitor to reach a second voltage from a first voltage; and a controller controlling the i/o buffer and the time measurer to measure the arrival time and controlling such that a value of a current related to an inspection of a DUT is measured using the arrival time.

Abstract: Disclosed is a container. The container includes a housing having an interior space, and a support part that supports an expendable component in the interior space, and the support part includes an alignment pin that aligns the expendable component.

Abstract: Provided is a test apparatus for testing a device under test (DUT), the apparatus operating at an operating frequency that is lower than an operating frequency of the DUT. The test apparatus includes a clock source which generates a clock according to the operating frequency of the test apparatus, a clock multiplier configured to multiply the generated clock source by a multiplication number which is set according to the operating frequency of the DUT and output a first clock for the DUT, a phase converter configured to shift a phase of the generated clock according to the multiplication number and output a plurality of second clocks having different phases, and a test pattern comparator configured to sequentially collect pieces of data from the DUT by sequentially applying the plurality of second clocks having different phases.

Abstract: The substrate treating apparatus includes a processing module and an index module on which a cassette having the substrate received therein is placed and that includes an index robot that transfers the substrate between the cassette and the processing module. The processing module includes a process chamber and a transfer chamber. The process chamber includes a support unit. The support unit includes a support on which the substrate is placed and a ring member that surrounds the substrate placed on the support and that is provided so as to be detachable from the support. The apparatus further includes a carrier storage unit that stores a carrier that is mounted on a hand of the main transfer robot or the index robot and on which the ring member is placed when the ring member is transferred by the main transfer robot or the index robot.

Abstract: Disclosed is an apparatus for transferring a substrate. The apparatus includes a transfer robot, a linear rail unit including a movable plate on which the transfer robot is mounted and a running shaft on which the movable plate travels, and a particle diffusion prevention member that prevents diffusion of particles to the outside by maintaining a differential pressure between the movable plate and the running shaft.

Abstract: The clipping device includes a connecting portion which is moved while being connected to a wire of the endoscope and has a body broken when tension more than a set value is applied thereto, a body portion which includes a first inside path portion through which the connecting portion moves and has a magnetic force, a cap portion which is located on a side of the body portion, includes a second inside path portion connected to the first inside path portion, and guides movement of the connecting portion, a clipping portion which is connected to the connecting portion protruding through the cap portion and contracts due to movement of the connecting portion to grip body tissue, and a connector which connects the body portion to the cap portion and includes a material biodegradable in a human body.