Patents by Inventor Byung Rae Cho

Byung Rae Cho has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for verifying semiconductor device tester
    Patent number: 6133727
    Abstract: A method for verifying correct operation and functional stability of a tester for semiconductor devices is disclosed. In addition, a method for creating a standard device for use with the tester is also disclosed. In creating a standard device according to the present invention, the tester repeatedly tests a candidate device a predefined number of times and evaluates the test results to determine whether the candidate device is suitable for use as a standard device. In verifying the operation and functional stability of a semiconductor device tester, data generated by repeatedly testing a standard device a predefined number of times are compared to recorded reference data of previous tests of the standard device.
    Type: Grant
    Filed: January 5, 1999
    Date of Patent: October 17, 2000
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Byoung Ok Chun, Byung Rae Cho, Sang Hon Lee, Yun Soon Park