Abstract: A wafer manufacturing method, an epitaxial wafer manufacturing method, and a wafer and epitaxial wafer manufactured thereby, are provided. The wafer manufacturing method enables the manufacture of a wafer with a low density of micropipe defects and minimum numbers of particles and scratches. The epitaxial wafer manufacturing method enables the manufacture of an epitaxial wafer that has low densities of defects such as downfall, triangular, and carrot defects, exhibits excellent device characteristics, and improves the yield of devices.

Abstract: A wafer manufacturing method, an epitaxial wafer manufacturing method, and a wafer and epitaxial wafer manufactured thereby, are provided. The wafer manufacturing method enables the manufacture of a wafer with a low density of micropipe defects and minimum numbers of particles and scratches. The epitaxial wafer manufacturing method enables the manufacture of an epitaxial wafer that has low densities of defects such as downfall, triangular, and carrot defects, exhibits excellent device characteristics, and improves the yield of devices.

Abstract: Provided is a pinion bearing that may be coupled to a pinion shaft of a vehicle. The pinion bearing may include at least one inner ring mounted on and coupled to a pinion shaft; an outer ring positioned outside the inner ring in a radial direction; and a plurality of rolling elements configured to rotatably support the inner ring relative to the outer ring. The outer ring may i a flange portion formed to extend outward in the radial direction, a first extension portion formed to extend from the flange portion toward a differential gear unit, and a second extension portion formed to extend from the flange portion toward an opposite side of the differential gear unit, and a heat dissipation fin(s) may be formed on the second extension portion to protrude outward in the radial direction.

Abstract: A computer-implemented integrated expert system for the identification of abnormal events in an industrial plant. The expert system integrates a model-based expert system with a rule-based expert system. The model-based expert system receives data on the operating conditions of a process unit in the industrial plant and calculates one or more results that determine whether the process unit is operating abnormally. The rule-based expert system also receives data on the operating conditions of the process unit and applies its rules to the process data. The rule-based expert system also applies its rules to the one or more results generated by the model-based expert system. The integrated system may also suppress any redundant messages generated by the model-based expert system.

Abstract: A computer-implemented integrated expert system for the identification of abnormal events in an industrial plant. The expert system integrates a model-based expert system with a rule-based expert system. The model-based expert system receives data on the operating conditions of a process unit in the industrial plant and calculates one or more results that determine whether the process unit is operating abnormally. The rule-based expert system also receives data on the operating conditions of the process unit and applies its rules to the process data. The rule-based expert system also applies its rules to the one or more results generated by the model-based expert system. The integrated system may also suppress any redundant messages generated by the model-based expert system.