Abstract: A multilayer electronic component includes: a body having a dielectric layer and first and second internal electrodes alternately disposed with each other while having the dielectric layer interposed therebetween in a first direction; and an external electrode including a connection portion and a band portion extending from the connection portion onto first and second surfaces of the body, wherein the external electrode further includes an electrode layer connected to one of the first and second internal electrodes, a resin layer in contact with the first and second surfaces, and a conductive resin layer disposed on the electrode layer and extending to the resin layer, and L1??L1 when L1 indicates a second-directional size of the resin layer in the band portion, and L1? indicates a second-directional size of the conductive resin layer in the band portion.

Abstract: A dual release actuator for a vehicle seat includes a motor, a cable carrier configured to receive power of the motor, thereby rotating to selectively pull one of two different cables, a Hall sensor to sense rotation of the motor, and a controller configured to count a sensing pulse of the Hall sensor for controlling rotation of the motor.

Abstract: Provided is a sequential injection module included in a skin treatment device, the module sequentially injecting a gas and a drug into the skin of a user through one needle. The sequential injection module comprises: a supply port for supplying each of gas and a drug; an output port for discharging each of same; and a channel control part for forming, therein, either a gas flow channel or a drug flow channel by means of the pressure of the gas and drug to be supplied.

Abstract: In a method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment, resistance values of pads of a probed chip are measured and stored. If a maximum resistance value among the stored resistance values is greater than a contact resistance reference value, a consecutive fail counting value and an accumulated fail counting value are increased. An automatic sanding command is generated to activate automatic sanding of a probe tip, when at least one of the consecutive fail counting value and the accumulated fail counting value is greater than a respective counting reference value. In this manner, false negative readings in the testing of semiconductor devices as the result of increased contact resistance between a probe tip and a pad in an EDS test are reduced and therefore device yield is improved.

Abstract: In a method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment, resistance values of pads of a probed chip are measured and stored. If a maximum resistance value among the stored resistance values is greater than a contact resistance reference value, a consecutive fail counting value and an accumulated fail counting value are increased. An automatic sanding command is generated to activate automatic sanding of a probe tip, when at least one of the consecutive fail counting value and the accumulated fail counting value is greater than a respective counting reference value. In this manner, false negative readings in the testing of semiconductor devices as the result of increased contact resistance between a probe tip and a pad in an EDS test are reduced and therefore device yield is improved.

Abstract: Disclosed are novel materials separated from Ecklonia cava, a method for extracting and purifying the same, and the use thereof for antioxidants. The method comprises extracting antioxidative ingredients from powdered Ecklonia cava one or more times with an organic solvent; fractionating the antioxidative ingredients one or more times in solvents; and purifying the solvent fractions by chromatography. Superior in scavenging activity and thermal stability, the extract from Ecklonia cava can be used as antioxidants and is suitable in commercialization.

Abstract: In a method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment, resistance values of pads of a probed chip are measured and stored. If a maximum resistance value among the stored resistance values is greater than a contact resistance reference value, a consecutive fail counting value and an accumulated fail counting value are increased. An automatic sanding command is generated to activate automatic sanding of a probe tip, when at least one of the consecutive fail counting value and the accumulated fail counting value is greater than a respective counting reference value. In this manner, false negative readings in the testing of semiconductor devices as the result of increased contact resistance between a probe tip and a pad in an EDS test are reduced and therefore device yield is improved.

Abstract: Disclosed are novel materials separated from Ecklonia cava, a method for extracting and purifying the same, and the use thereof for antioxidants. The method comprises extracting antioxidative ingredients from powdered Ecklonia cava one or more times with an organic solvent; fractionating the antioxidative ingredients one or more times in solvents; and purifying the solvent fractions by chromatography. Superior in scavenging activity and thermal stability, the extract from Ecklonia cava can be used as antioxidants and is suitable in commercialization.

Abstract: Disclosed are whitening cosmetics containing extracts from Ecklonia cava. More specifically, Ecklonia cava which has been dried and crushed into powder, is immersed in a solvent, deposited to extract whitening materials, then, the materials are distilled under reduced pressure to obtain extracts from Ecklonia cava, which are added to whitening cosmetics. The whitening cosmetics containing the extracts from Ecklonia cava of the present invention exhibit excellent whitening effect because of strongly inhibiting tyrosinase activity.