Patents by Inventor Byungsool Moon

Byungsool Moon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Pattern detection for integrated circuit substrates
    Patent number: 7277813
    Abstract: A method for selecting test site locations on a substrate, by a) specifying a subset of all test site locations on the substrate, and b) selecting a desired number of candidate test site locations from within the subset of test site locations on the substrate. c) While selecting one of the candidate test site locations and holding all others of the candidate test site locations as fixed, determining a new location for the selected one of the candidate test site locations, which new location increases a test sensitivity, as estimated by a trace of a variance-covariance matrix. d) Repeating step (c) for each candidate test site location in the subset of test site locations, to produce a finalized set of candidate test site locations, until a desired end point is attained.
    Type: Grant
    Filed: April 28, 2005
    Date of Patent: October 2, 2007
    Assignees: State of Oregon University Portland State, LSI Corporation
    Inventors: Bruce J. Whitefield, Paul J. Rudolph, James N. McNames, Byungsool Moon
  • Pattern detection for integrated circuit substrates
    Publication number: 20060190207
    Abstract: A method for selecting test site locations on a substrate, by a) specifying a subset of all test site locations on the substrate, and b) selecting a desired number of candidate test site locations from within the subset of test site locations on the substrate. c) While selecting one of the candidate test site locations and holding all others of the candidate test site locations as fixed, determining a new location for the selected one of the candidate test site locations, which new location increases a test sensitivity, as estimated by a trace of a variance-covariance matrix. d) Repeating step (c) for each candidate test site location in the subset of test site locations, to produce a finalized set of candidate test site locations, until a desired end point is attained.
    Type: Application
    Filed: April 28, 2005
    Publication date: August 24, 2006
    Inventors: Bruce Whitefield, Paul Rudolph, James McNames, Byungsool Moon