Patents by Inventor Byung-Woo Park

Byung-Woo Park has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250019135
    Abstract: A sealing structure may include a lid including a first lid face, a second lid face opposite to the first lid face, and a fragile area between the first lid face and the second lid face, a cover including a first cover face facing the second lid face and covering the fragile area and a second cover face opposite to the first cover face, wherein a first distance between the second lid face and the first cover face is substantially equal to or less than a second distance between the first cover face and the second cover face, and a connector configured to connect the lid and the cover.
    Type: Application
    Filed: September 30, 2024
    Publication date: January 16, 2025
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Wooram HONG, Hyun Do CHOI, Dal HEO, Youngchun KWON, Hyukju KWON, Gahee KIM, Bosung KIM, Jeonghun KIM, Jin Woo KM, Min Sik PARK, Youngjin PARK, Hyungtae SEO, Won Seok OH, Dongseon LEE, Sangyoon LEE, Jaejun CHANG, Jun Won JANG, Hyunjeong JEON, Joon-Kee CHO, Byung-Kwon CHOI, Won Je CHOI, Younsuk CHOI, Taesin HA
  • Patent number: 7535236
    Abstract: The present invention relates to a thickness measurement method for thin films using microwaves. In the method, the Q-factors of a dielectric resonator are measured. The effective surface resistance (RSeff) of a superconductor or a conductor film and the loss tangent of a dielectric are determined using the Q-factor. The penetration depth ? for the superconductor film is measured using a dielectric resonator with a small gap between the superconductor film at the top of the resonator and the rest. The intrinsic surface resistance of superconductor films for calibration is determined using the measured RSeff and ? while the intrinsic surface resistance of a conductor film for calibration is determined using the measured RSeff and the nature of the intrinsic surface resistance being equal to the intrinsic surface reactance.
    Type: Grant
    Filed: September 28, 2006
    Date of Patent: May 19, 2009
    Assignee: Konkuk University Industrial Cooperation Corp.
    Inventors: Sang Young Lee, Jae Hun Lee, Hyun Kyung Han, Sang Geun Lee, Byung Woo Park
  • Publication number: 20080205595
    Abstract: The present invention relates to a thickness measurement method for thin films using microwaves. In the method, the Q-factors of a dielectric resonator are measured. The effective surface resistance (RSeff) of a superconductor or a conductor film and the loss tangent of a dielectric are determined using the Q-factor. The penetration depth ? for the superconductor film is measured using a dielectric resonator with a small gap between the superconductor film at the top of the resonator and the rest. The intrinsic surface resistance of superconductor films for calibration is determined using the measured RSeff and ? while the intrinsic surface resistance of a conductor film for calibration is determined using the measured RSeff and the nature of the intrinsic surface resistance being equal to the intrinsic surface reactance.
    Type: Application
    Filed: September 28, 2006
    Publication date: August 28, 2008
    Applicant: KONKUK UNIVERSITY INDUSTRIAL COOPERATION CORP.
    Inventors: Sang Young Lee, Jae Hun Lee, Hyun Kyung Han, Sang Geun Lee, Byung Woo Park
  • Patent number: 6916580
    Abstract: A positive active material for a rechargeable lithium battery is provided. The positive active material comprises a lithiated intercalation compound and a coating layer formed on the lithiated intercalation compound. The coating layer comprises a solid-solution compound and an oxide compound having at least two coating elements, the oxide compound represented by the following Formula 1: MpM?qOr??(1) wherein M and M? are not the same and are each independently at least one element selected from the group consisting of Zr, Al, Na, K, Mg, Ca, Sr, Ni, Co, Ti, Sn, Mn, Cr, Fe, and V; 0<p<1; 0<q<1; and 1<r?2, where r is determined based upon p and q. The solid-solution compound is prepared by reacting the lithiated intercalation compound with the oxide compound. The coating layer has a fracture toughness of at least 3.5 MPam1/2. A method of making the positive active material is also provided.
    Type: Grant
    Filed: October 15, 2002
    Date of Patent: July 12, 2005
    Assignee: Samsung SDE Co., Ltd.
    Inventors: Jae-Phil Cho, Byung-Woo Park, Yong-Jeong Kim, Tae-Jun Kim
  • Publication number: 20030087155
    Abstract: A positive active material for a rechargeable lithium battery is provided. The positive active material comprises a lithiated intercalation compound and a coating layer formed on the lithiated intercalation compound.
    Type: Application
    Filed: October 15, 2002
    Publication date: May 8, 2003
    Inventors: Jae-Phil Cho, Byung-Woo Park, Yong-Jeong Kim, Tae-Jun Kim