Patents by Inventor C. Bradford Hopper

C. Bradford Hopper has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6140140
    Abstract: A method and apparatus that uses compound processing for detecting defects in integrated circuits involves processing two portions of a semiconductor wafer differently according to a first and a second process. The first process and the second process are performed on alternating columns on the wafer. Image subtraction is used to detect differences between the layouts in adjacent columns. After differences are detected, the layout is examined to determine whether the difference represents a defect. If so, the design rules of the layout can be changed to accommodate a wider process variation.
    Type: Grant
    Filed: September 16, 1998
    Date of Patent: October 31, 2000
    Assignee: Advanced Micro Devices, Inc.
    Inventor: C. Bradford Hopper
  • Patent number: 6040912
    Abstract: A method and apparatus for detecting random layout structures sensitive to process induced pattern errors in semiconductor device manufacturing applies a first manufacturing process to a first wafer containing semiconductor devices. A second manufacturing process is applied to a second wafer containing semiconductor devices. The second manufacturing process is similar to, but different from the first manufacturing process. The first and second wafers are compared by image subtraction to detect systematic pattern defects in the semiconductor devices of one of the first and second wafers. After differences are detected, the layout is examined to determine whether the difference represents a defect. If so, the design rules of the layout can be changed to accommodate a wider process variation and improve processing yield.
    Type: Grant
    Filed: September 30, 1998
    Date of Patent: March 21, 2000
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Steven J. Zika, C. Bradford Hopper
  • Patent number: 5985364
    Abstract: Spin-on coatings are applied by ramping-up the exhaust level in the spin coating chamber to achieve a predetermined minimum exhaustion level prior to accelerating rotation of the coating substrate to a high speed to effect spreading of the coating fluid. The resulting spun-on coatings exhibit reduced defect formation and reduced aerosol particle redeposition thereon.
    Type: Grant
    Filed: April 6, 1998
    Date of Patent: November 16, 1999
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Jonathan B. Smith, C. Bradford Hopper