Patents by Inventor C. Bruneel

C. Bruneel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement of the thickness of layers of material by ultrasonic interferometry
    Patent number: 4862747
    Abstract: The invention relates to a method for the automatic correction of the variations of efficiency of an electroacoustic transducer as a function of the frequency for improving the accuracy of a device measuring the thickness of layers of materials by ultrasonic interferometry.
    Type: Grant
    Filed: August 3, 1987
    Date of Patent: September 5, 1989
    Assignee: M.T.W. Leader Sarl
    Inventors: Pierre Boudy, Martine Houze, C. Bruneel, Jean L. Bigotte