Patents by Inventor C. David Baer

C. David Baer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for obtaining the distance from an optical measurement instrument to an object under test
    Patent number: 7887184
    Abstract: Systems and methods for measuring a distance from a reference plane of an optical measurement instrument to a reference plane of an optical device under test are disclose. In one embodiment a system for measuring this distance includes an illumination system, an optical system, and optical sensor and a processor. The illumination system is configured or adapted to illuminate the object under test. The optical system is configured or adapted to receive light from the object under test and to produce an aberrated image. The optical sensor is configured or adapted to receive and sense the aberrated image. The processor determines the distance from the reference plane of the optical measurement instrument to the reference plane of the optical device based on an aspect of the aberrated image sensed by the optical sensor.
    Type: Grant
    Filed: November 9, 2007
    Date of Patent: February 15, 2011
    Assignee: AMO Wavefront Sciences LLC.
    Inventors: C. David Baer, Daniel R. Neal, Richard James Copland, David Austin Neal
  • METHOD AND APPARATUS FOR OBTAINING THE DISTANCE FROM AN OPTICAL MEASUREMENT INSTRUMENT TO AN OBJECT UNDER TEST
    Publication number: 20080291396
    Abstract: Systems and methods for measuring a distance from a reference plane of an optical measurement instrument to a reference plane of an optical device under test are disclose. In one embodiment a system for measuring this distance includes an illumination system, an optical system, and optical sensor and a processor. The illumination system is configured or adapted to illuminate the object under test. The optical system is configured or adapted to receive light from the object under test and to produce an aberrated image. The optical sensor is configured or adapted to receive and sense the aberrated image. The processor determines the distance from the reference plane of the optical measurement instrument to the reference plane of the optical device based on an aspect of the aberrated image sensed by the optical sensor.
    Type: Application
    Filed: November 9, 2007
    Publication date: November 27, 2008
    Applicant: Wavefront Sciences, Inc.
    Inventors: C. David Baer, Daniel R. Neal, Richard James Copland, David Austin Neal