Abstract: Computer-implemented methods, systems and apparatus, including computer program apparatus, provide techniques for designing a set of experiments to be performed with a set of resources. A plurality of experimental configurations are generated based on a set of parameters describing factors to be varied in the experiments and a set of constraints representing limitations on operations that can be performed with the set of resources. A set of experiments is defined based on a selected configuration. The constraints can be represented as patterns defining an application of a parameter to a set of one or more points of an experimental lattice.

Abstract: The invention provides methods, apparatus, and systems for performing high-throughput preparation and screening of salts and polymorphs of drug candidates. The invention is directed towards enhancing the pre-formulation discovery process used for drug development. In particular, processes that determine suitable salts and processes that discover substantially every polymorph that can form from a particular drug candidate are provided. The processes are performed using several apparatuses that are specifically configured to carry-out various steps in a high-throughput characterization process. One such apparatus is configured for synthesizing a plurality of library members based on, for example, a library model generated by a computer system. Another apparatus may filter the synthesized solution to provide a substantially pure mixture that can be subjected to salt or polymorph testing.

Abstract: Low dielectric materials and films comprising same have been identified for improved performance when used as performance materials, for example, in interlevel dielectrics integrated circuits as well as methods for making same. In one aspect of the present invention, the performance of the dielectric material may be improved by controlling the weight percentage of ethylene oxide groups in the at least one porogen.

Abstract: Low dielectric materials and films comprising same have been identified for improved performance when used as performance materials, for example, in interlevel dielectrics integrated circuits as well as methods for making same. In one aspect of the present invention, the performance of the dielectric material may be improved by controlling the weight percentage of ethylene oxide groups in the at least one porogen.

Abstract: Low dielectric materials and films comprising same have been identified for improved performance when used as interlevel dielectrics in integrated circuits as well as methods for making same. These materials are characterized as having a dielectric constant (?) a dielectric constant of about 3.7 or less; a normalized wall elastic modulus (E0?), derived in part from the dielectric constant of the material, of about 15 GPa or greater; and a metal impurity level of about 500 ppm or less. Low dielectric materials are also disclosed having a dielectric constant of less than about 1.95 and a normalized wall elastic modulus (E0?), derived in part from the dielectric constant of the material, of greater than about 26 GPa.

Abstract: Apparatus and methods are provided for efficiently and non-destructively determining the thermal properties of materials having arbitrary surface textures. Two regions of a sample are each contacted by respective pairs of probes, where each pair includes a first probe made of a first material and a second probe made of a second material. A voltage sensor is arranged between the two probes of each pair, and between the probes of the same material from each pair. Nodes connect the voltage sensors to the probes. A temperature gradient is established between the two regions, while the nodes are maintained at a constant temperature. The Seebeck coefficient of the material and the temperatures of the regions can be determined from the voltages measured by the voltage sensors.

Abstract: An analytical measurement system includes a sample holder, a temperature changing device for changing the temperature of a sample on the sample holder, and a measurement device for detecting a change in the sample such as a phase change. The sample holder can be a micro sample holder including a support member having an aperture, a membrane spanning the aperture, and a backing layer attached to a backside of the membrane. The temperature changing device can be a laser directed at the backside of the sample holder or an electrical resistive heater on the sample holder. The measurement device senses changes in the sample such as the film stress, viscosity, or surface reflectivity, by measuring changes in scattered light, reflected light, emitted light, or electrical resistance.

Abstract: The gradient deposition method and apparatus permits a radial thickness or composition gradient on a substrate to be formed. The system comprises one or more deposition sources that can be fired sequentially or simultaneously. The system also comprises one or more dynamic shutters (e.g., shutters that can be moved independently of each other and during the deposition of a material) in combination with equipment that permits the substrate to be rotated during the deposition of the material onto the substrate. The system may also include one or more contact masks that may be placed on the substrate during the deposition in order to mask off particular portions of the substrate during the deposition process.

Abstract: A power circuit breaker controller and its method of use. Surge voltages associated with the closing of a high voltage circuit breaker for a polyphase alternating current line are lowered substantially by our invention. Although several lines and phases are involved, each is considered and operated independently of the other. All lines have preinserted closing resistors, to reduce the surge voltages, that are preinserted in parallel across the main contacts of each phase one step prior to the main contact closing. Between the resistor switch closings certain staggering takes place. For example, if 3 phases are involved the resistor closings are staggered by about 60 or more electrical degrees. Further, there is circuitry to insure that the polarity of the bus side phase-to-ground voltage is of the same polarity as the trapped charges on the corresponding phases on the line side of the breaker when the resistor switch contacts are engaged.