Patents by Inventor Camiel Heffels

Camiel Heffels has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110032514
    Abstract: The invention relates to a NDIR-gas analyser comprising an infrared radiation source (1), a measuring vessel (3) containing a gas mixture (4) having a measuring gas component (5) that is to be detected, and a detector device (7) that is arranged behind the measuring vessel that can detect the influence of ageing of the radiation source (1) and optionally dirt deposits in the optical radiation path without interrupting measuring. According to the invention, at least one optopneumatic detector (15) is arranged in the beam path of the radiation source (1), said detector being filled with any gas (16) when arranged between the radiation source (1) and the measuring vessel (3).
    Type: Application
    Filed: February 15, 2009
    Publication date: February 10, 2011
    Applicant: Siemens AG
    Inventors: Ralf Bitter, Camiel Heffels, Thomas Hörner, Ludwig Kimmig, Martin Kionke, Michael Ludwig
  • Publication number: 20100134784
    Abstract: A detector arrangement for detection of a measuring gas component in a gas mixture is provided. The arrangement includes a gas analyzer, a first single-layer receiver and a further single-layer receiver, the first single-layer receiver containing the measuring gas component and the further single-layer receiver containing a transverse gas. A concentration of the measuring gas component in the gas mixture is determined from signals delivered by sensors of the single-layer receivers. An evaluating device includes an n-dimensional calibration matrix for obtaining matrix signal values. Signal values of different known concentrations of the measuring gas component in the presence of different known transverse gas concentrations are stored as n-tubules in the evaluating device.
    Type: Application
    Filed: April 25, 2008
    Publication date: June 3, 2010
    Inventors: Ralf Bitter, Camiel Heffels, Thomas Hömer
  • Publication number: 20080247906
    Abstract: A device for determining and/or monitoring an analyte contained in a fluidic process medium. The device comprises a sensor, which contains a process membrane with a porous support structure, a luminescent substance, that comes into contact with the analyte or gaseous process medium, being embedded in said support structure, an emitter unit, whose radiation excites the luminescent substance, causing it to emit luminescent radiation, a receiver unit, which detects the luminescent radiation and a control/evaluation unit, which determines the concentration or the partial pressure or pressure of the analyte using the quenching of the luminescent radiation of the luminescent substance. According to the invention, the porous support structure comprises plastic, ceramic, metal or foamed plastic.
    Type: Application
    Filed: April 14, 2005
    Publication date: October 9, 2008
    Applicant: Endress + Hauser Conducta GmbH + Co. KG
    Inventors: Camiel Heffels, Ralf Bernhard, Johannes Reichert
  • Patent number: 7428051
    Abstract: The invention relates to a device for the IR-spectrometric analysis of a solid, liquid or gaseous medium. The device includes a process probe, which has a reflection element. The device additionally includes a linear variable filter, at least one detector element, and a control/evaluation unit. At least one light source is also provided, the light of which is coupled into the reflection element via a collimating optics. At least one optical waveguide having a light input section and a light output section is provided. The light is guided via the light output section of the optical waveguide into a defined region of the linear variable filter. The detector element and the linear variable filter are arranged movably relative to one another over approximately the length of the linear variable filter. The control/evaluation unit determines the spectrum of the medium on the basis of the measured values delivered from the detector element.
    Type: Grant
    Filed: July 18, 2003
    Date of Patent: September 23, 2008
    Assignee: Endress + Hauser Conducta Gesellschaft fur Mess-u. Regeltechnik mgH + Co. KG
    Inventors: Camiel Heffels, Dirk Steinmueller, Dick Scholten, Peter Lindmueller
  • Publication number: 20060115201
    Abstract: The invention relates to a device for the IR-spectrometric analysis of a solid, liquid or gaseous medium. The device includes a process probe, which has a reflection element. The device additionally includes a linear variable filter, at least one detector element, and a control/evaluation unit. At least one light source is also provided, the light of which is coupled into the reflection element via a collimating optics. At least one optical waveguide having a light input section and a light output section is provided. The light is guided via the light output section of the optical waveguide into a defined region of the linear variable filter. The detector element and the linear variable filter are arranged movably relative to one another over approximately the length of the linear variable filter. The control/evaluation unit determines the spectrum of the medium on the basis of the measured values delivered from the detector element.
    Type: Application
    Filed: July 18, 2003
    Publication date: June 1, 2006
    Applicant: Endress + Hauset Conducta GmbH + Co. KG
    Inventors: Camiel Heffels, Dirk Steinmueller, Dick Scholten, Peter Lindmueller
  • Publication number: 20060051238
    Abstract: An on-line analyzer for analyzing a test sample, having a measuring device, which includes at least one measuring cell and at least one optoelectronic component. The measuring device determines, at at least one wavelength, the transmission or absorption of electromagnetic radiation passing through the test sample and provides measurement signals. The analyzer further includes a control/evaluation unit, which evaluates the measurement signals delivered by the measuring device and makes analysis data available. The measuring cell and the control/evaluation unit are located spatially separated from one another; the at least one optoelectronic component of the measuring device is assigned to the control/evaluation unit; the measuring cell and the at least one optoelectronic component are connected together via a light wave conductor.
    Type: Application
    Filed: May 17, 2003
    Publication date: March 9, 2006
    Applicant: Endress + Hauser Conducta GmbH + Co. KG
    Inventors: Ralf Steuerwald, Camiel Heffels, Dirk Steinmueller
  • Patent number: 6674529
    Abstract: The present invention creates an apparatus for determining physical collective parameters of particles in gases, which comprises a measuring chamber with light entrance ports (121) and exit ports (123, 124) for electromagnetic radiation, an emission source (113) for electromagnetic radiation being provided and at least two detection apparatuses (114, 115) for determining the intensity of electromagnetic radiation scattered at the particles being provided, and the detection apparatuses (114, 115) detecting electromagnetic radiation of different scattering regions. The present invention further creates a method for determining physical collective parameters of particles in gases, the particles being exposed to electromagnetic radiation which is scattered at the particles, wherein the intensities of the scattered radiation of at least two different scattering regions are determined and their ratio is taken subsequently.
    Type: Grant
    Filed: July 27, 2001
    Date of Patent: January 6, 2004
    Assignee: BASF Aktiengesellschaft
    Inventors: Bernd Sachweh, Camiel Heffels, Matthias Rädle, Helmut Biermann, Hans Jürgen Eisen, Jürgen Ettmüller, Johannes G Reuvers
  • Patent number: 6535283
    Abstract: The disclosure is a probelike apparatus (16) for spectroscopic analysis of a fluid medium (19) by attenuated reflection. Two light beams from a light source (11) impinge upon the boundary (18) between a prism (17) and the medium (19) to be analyzed and the intensities of the light beams reflected at the boundary are measured in a detector unit (22). The two light beams differ in their angle of incidence on the boundary and/or in their polarization state. Measurement is preferably carried out under total reflection.
    Type: Grant
    Filed: December 3, 1999
    Date of Patent: March 18, 2003
    Assignee: BASF Aktiengesellschaft
    Inventors: Camiel Heffels, Thomas Beuermann, Matthias Rädle, Benno Sens, Alfred Rennig, Jürgen Ettmüller
  • Publication number: 20020018204
    Abstract: The present invention creates an apparatus for determining physical collective parameters of particles in gases, which comprises a measuring chamber with light entrance ports (121) and exit ports (123, 124) for electromagnetic radiation, an emission source (113) for electromagnetic radiation being provided and at least two detection apparatuses (114, 115) for determining the intensity of electromagnetic radiation scattered at the particles being provided, and the detection apparatuses (114, 115) detecting electromagnetic radiation of different scattering regions. The present invention further creates a method for determining physical collective parameters of particles in gases, the particles being exposed to electromagnetic radiation which is scattered at the particles, wherein the intensities of the scattered radiation of at least two different scattering regions are determined and their ratio is taken subsequently.
    Type: Application
    Filed: July 27, 2001
    Publication date: February 14, 2002
    Inventors: Bernd Sachweh, Camiel Heffels, Matthias Radle, Helmut Biermann, Hans Jurgen Eisen, Jurgen Ettmuller, Johannes G. Reuvers