Abstract: The test fixture for automatic testing equipment of the present invention includes a cover pivotally mounted to an electronic test bed, and means mounted to the cover and operative as the cover is closed to provide full surface contact with an electrical circuit device to be tested. In preferred embodiment, the test fixture includes a spring-loaded lid that is snap-latchable to, and push-button releasable from, a test bed. A lid panel-inset is rotatably mounted to the lid at a preselected acute angle thereto. The angle is selected such that the panel-inset provides full surface contact with an electrical circuit to be tested when the lid engages the electrical device. The panel-inset rotates to maintain full surface contact while the lid is latched to the test bed.