Patents by Inventor Carl Bowen

Carl Bowen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • DETERMINING DIE PERFORMANCE BY INCORPORATING NEIGHBORING DIE PERFORMANCE METRICS
    Publication number: 20080244348
    Abstract: A method includes receiving a first set of parameters associated with a plurality of die. A first die performance metric associated with a selected die is determined based on the first set of parameters. At least one neighborhood die performance metric associated with a set comprised of a plurality of die that neighbor the selected die is determined based on the first set of parameters. A second die performance metric is determined for the selected die based on the first die performance metric and the neighborhood die performance metric.
    Type: Application
    Filed: March 29, 2007
    Publication date: October 2, 2008
    Inventors: Daniel Kadosh, Gregory A. Cherry, Carl Bowen, Luis De La Fuente, Rajesh Vijayaraghavan
  • Determining Die Health by Expanding Electrical Test Data to Represent Untested Die
    Publication number: 20080172189
    Abstract: A method includes receiving a first set of parameters associated with a subset of a plurality of die on a wafer subjected to testing. The first set of data is expanded to generate estimated values for the first set of parameters for at least one untested die not included in the subset. A die health metric is determined for at least a portion of the plurality of die based on the first set of parameters including the estimated values.
    Type: Application
    Filed: January 16, 2007
    Publication date: July 17, 2008
    Inventors: Daniel Kadosh, Gregory A. Cherry, Carl Bowen, Luis De La Fuente, Rajesh Vijayaraghavan