Patents by Inventor Carl Treadwell
Carl Treadwell has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20110008947Abstract: Embodiments of the present invention generally relate to a system used to form solar cell devices using processing modules adapted to perform one or more processes in the formation of the solar cell devices. In one embodiment, the system is adapted to form thin film solar cell devices by accepting a large unprocessed substrate and performing multiple deposition, material removal, cleaning, bonding, testing, and sectioning processes to form one or more complete, functional, and tested solar cell devices in custom sizes and/or shapes that can then be shipped to an end user for installation in a desired location to generate electricity. In one embodiment, the system is adapted to form one or more BIPV panels in custom sizes and/or shapes from a single large substrate for shipment to an end user.Type: ApplicationFiled: June 17, 2010Publication date: January 13, 2011Applicant: APPLIED MATERIALS, INC.Inventors: KEVIN LAUGHTON CUNNINGHAM, Carl Treadwell, Tzay-Fa Su, Uday Mahajan, Sarin Sundar Jainnagar Kuppuswamy
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Patent number: 6862096Abstract: Scattered radiation from a sample surface is collected by means of a collector that collects radiation substantially symmetrically about a line normal to the surface. The collected radiation is directed to channels at different azimuthal angles so that information related to relative azimuthal positions of the collected scattered radiation about the line is preserved. The collected radiation is converted into respective signals representative of radiation scattered at different azimuthal angles about the line. The presence and/or characteristics of anomalies are determined from the signals. Alternatively, the radiation collected by the collector may be filtered by means of a spatial filter having an annular gap of an angle related to the angular separation of expected pattern scattering. Signals obtained from the narrow and wide collection channels may be compared to distinguish between micro-scratches and particles.Type: GrantFiled: February 6, 2003Date of Patent: March 1, 2005Assignee: KLA-Tencor CorporationInventors: Mehdi Vaez-Iravani, Jeffrey Alan Rzepiela, Carl Treadwell, Andrew Zeng, Robert Fiordalice
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Publication number: 20050018181Abstract: Scattered radiation from a sample surface is collected by means of a collector that collects radiation substantially symmetrically about a line normal to the surface. The collected radiation is directed to channels at different azimuthal angles so- that information related to relative azimuthal positions of the collected scattered radiation about the line is preserved. The collected radiation is converted into respective signals representative of radiation scattered at different azimuthal angles about the line. The presence and/or characteristics of anomalies are determined from the signals. Alternatively, the radiation collected by the collector may be filtered by means of a spatial filter having an annular gap of an angle related to the angular separation of expected pattern scattering. Signals obtained from the narrow and wide collection channels may be compared to distinguish between micro-scratches and particles.Type: ApplicationFiled: August 16, 2004Publication date: January 27, 2005Inventors: Mehdi Vaez-Iravani, Jeffrey Rzepiela, Carl Treadwell, Andrew Zeng, Robert Fiordalice
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Publication number: 20030210393Abstract: Scattered radiation from a sample surface is collected by means of a collector that collects radiation substantially symmetrically about a line normal to the surface. The collected radiation is directed to channels at different azimuthal angles so that information related to relative azimuthal positions of the collected scattered radiation about the line is preserved. The collected radiation is converted into respective signals representative of radiation scattered at different azimuthal angles about the line. The presence and/or characteristics of anomalies are determined from the signals. Alternatively, the radiation collected by the collector may be filtered by means of a spatial filter having an annular gap of an angle related to the angular separation of expected pattern scattering. Signals obtained from the narrow and wide collection channels may be compared to distinguish between micro-scratches and particles.Type: ApplicationFiled: February 6, 2003Publication date: November 13, 2003Applicant: KLA-Tencor CorporationInventors: Mehdi Vaez-Iravani, Jeffrey Alan Rzepiela, Carl Treadwell, Andrew Zeng, Robert Fiordalice
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Patent number: 6538730Abstract: Scattered radiation from a sample surface is collected by means of a collector that collects radiation substantially symmetrically about a line normal to the surface. The collected radiation is directed to channels at different azimuthal angles so that information related to relative azimuthal positions of the collected scattered radiation about the line is preserved. The collected radiation is converted into respective signals representative of radiation scattered at different azimuthal angles about the line. The presence and/or characteristics of anomalies are determined from the signals. Alternatively, the radiation collected by the collector may be filtered by means of a spatial filter having an annular gap of an angle related to the angular separation of expected pattern scattering. Signals obtained from the narrow and wide collection channels may be compared to distinguish between micro-scratches and particles.Type: GrantFiled: April 6, 2001Date of Patent: March 25, 2003Assignee: Kla-Tencor Technologies CorporationInventors: Mehdi Vaez-Iravani, Jeffrey Alan Rzepiela, Carl Treadwell, Andrew Zeng, Robert Fiordalice
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Publication number: 20020145732Abstract: Scattered radiation from a sample surface is collected by means of a collector that collects radiation substantially symmetrically about a line normal to the surface. The collected radiation is directed to channels at different azimuthal angles so that information related to relative azimuthal positions of the collected scattered radiation about the line is preserved. The collected radiation is converted into respective signals representative of radiation scattered at different azimuthal angles about the line. The presence and/or characteristics of anomalies are determined from the signals. Alternatively, the radiation collected by the collector may be filtered by means of a spatial filter having an annular gap of an angle related to the angular separation of expected pattern scattering. Signals obtained from the narrow and wide collection channels may be compared to distinguish between micro-scratches and particles.Type: ApplicationFiled: April 6, 2001Publication date: October 10, 2002Inventors: Mehdi Vaez-Iravani, Jeffrey Alan Rzepiela, Carl Treadwell, Andrew Zeng, Robert Fiordalice
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Patent number: 6177143Abstract: Electron beam cured siloxane dielectric films and to a process for their manufacture which are useful in the production of integrated circuits. A siloxane polymer having in one aspect less than 40 Mole percent carbon containing substituents, and in another aspect at least approximately 40 Mole percent carbon containing substituents is cured by a wide beam electron beam exposure.Type: GrantFiled: January 6, 1999Date of Patent: January 23, 2001Inventors: Carl Treadwell, Jingjun Yang, Matthew Ross