Abstract: A technique for testing digital-to-analog converters includes providing a set of digital input signals to the digital-to-analog converters and comparing a resulting combined output signal from the digital-to-analog converters to a comparison value. A determination is made as to whether the resulting combined output signal is within a predetermined tolerance defined by the comparison value. An apparatus for testing digital-to-analog converters also is disclosed.

Abstract: An apparatus for the rapid removal of an extraneous portion of a produce item with minimal loss. The apparatus, rendered attachable to an agricultural processing implement by an integral attachment device, enables one-handed operation by a user. The apparatus includes a base section in operative combination with an elevated blade that not only enables the severing of the extraneous portion from the produce body, but also separates the extraneous portion therefrom, and guides the cleaned produce body towards a collection device, for instance, a picking box.

Abstract: A method for characterizing defects of integrated circuits on a semiconductor wafer includes storing at least one reference wafer map in a memory corresponding to a known defect pattern of the integrated circuits caused during a manufacturing step thereof, testing the integrated circuits for defects, generating a test wafer map for the semiconductor wafer comprising a pattern of each defective integrated circuit thereon, comparing the test wafer map to the at least one reference wafer map to determine if the known defect pattern is present in the test wafer map, and generating a new reference wafer map corresponding to the test wafer map if the test wafer map has an unknown defect pattern. An apparatus for characterizing defects of integrated circuit die on a semiconductor wafer is also provided.

Abstract: A method for processing semiconductor wafers includes forming a plurality of wafers each comprising a plurality of dies, performing a plurality of tests on the dies to determine good dies and failed dies, and packaging the good dies. The tests are performed on the good dies after packaging to determine good packaged dies and failed packaged dies. A determination is made as to which tests indicate both failed dies and failed packaged dies so that corrective action may be taken. A database is formed to include test data collected at wafer level on dies before they are packaged, and test data collected at package level after the good dies have been packaged. The database and the results of the test comparisons are made available via the Internet so that other facilities processing the same type devices can review and compare the information to their own data. A global or worldwide monitoring of the test data is thus made available.

Abstract: An apparatus for the rapid removal of an extraneous portion of a produce item with minimal loss. The apparatus, rendered attachable to an agricultural processing implement by an integral attachment device, enables one-handed operation by a user. The apparatus includes a base section in operative combination with an elevated blade that not only enables the severing of the extraneous portion from the produce body, but also separates the extraneous portion therefrom, and guides the cleaned produce body towards a collection device, for instance, a picking box.

Abstract: Method for the rapid cleaning of produce with minimal loss, and apparatus to perform the method. The cleaning method taught in the present application enables the rapid cleaning of produce by removing an extraneous portion therefrom, by separating the extraneous portion from the body of the produce, and by urging the cleaned produce towards a collection device. These steps are attainable, using the principles of the present invention, by a working using only one motion and one hand. To perform the method, a novel aperture knife is taught which, rendered attachable to an agricultural processing implement by an integral attachment device, enables one-handed operation by a user. The knife includes a generally planar knife body in operative combination with an elevated blade which not only enables the severing of the extraneous portion from the produce body, but separates the extraneous portion therefrom, and guides the cleaned produce body towards a collection device, for instance a picking box.

Abstract: Method for the rapid cleaning of produce with minimal loss, and apparatus to perform the method. The cleaning method taught in the present application enables the rapid cleaning of produce by removing an extraneous portion therefrom, by separating the extraneous portion from the body of the produce, and by urging the cleaned produce towards a collection device. These steps are attainable, using the principles of the present invention, by a working using only one motion and one hand. To perform the method, a novel aperture knife is taught which, rendered attachable to an agricultural processing implement by an integral attachment device, enables one-handed operation by a user. The knife includes a generally planar knife body in operative combination with an elevated blade which not only enables the severing of the extraneous portion from the produce body, but separates the extraneous portion therefrom, and guides the cleaned produce body towards a collection device, for instance a picking box.