Abstract: A method and system for reading a security seal having a unique far-field pattern are described. Periodic nano-structure is generated on the surface of a substrate having spacings of hundreds of nanometers, or smaller, and affixed on a product, or generated directly onto the product. A laser beam having a wavelength longer than the periodic spacings directed onto at least a portion of the surface of the substrate at a chosen angle of incidence and a selected azimuthal angle relative to a chosen direction produces a unique far-field pattern that may be imaged by a digital image detector disposed at a chosen distance from the illuminated region, compared with a stored reference, and validated. The nanoscale sub-wavelength patterns can be printed using extreme ultraviolet light and read with readily available visible or ultraviolet light. The security seal contains a pattern that is invisible to the eye and to an optical microscope.

Abstract: A method and system for reading a security seal having a unique far-field pattern are described. Periodic nano-structure is generated on the surface of a substrate having spacings of hundreds of nanometers, or smaller, and affixed on a product, or generated directly onto the product. A laser beam having a wavelength longer than the periodic spacings directed onto at least a portion of the surface of the substrate at a chosen angle of incidence and a selected azimuthal angle relative to a chosen direction produces a unique far-field pattern that may be imaged by a digital image detector disposed at a chosen distance from the illuminated region, compared with a stored reference, and validated. The nanoscale sub-wavelength patterns can be printed using extreme ultraviolet light and read with readily available visible or ultraviolet light. The security seal contains a pattern that is invisible to the eye and to an optical microscope.

Abstract: Ablation of holes having diameters as small as 82 nm and having clean walls was obtained in a poly(methyl methacrylate) on a silicon substrate by focusing pulses from a Ne-like Ar, 46.9 nm wavelength, capillary-discharge laser using a freestanding Fresnel zone plate diffracting into third order is described. Spectroscopic analysis of light from the ablation has also been performed. These results demonstrate the use of focused coherent EUV/SXR light for the direct nanoscale patterning of materials.

Abstract: Ablation of holes having diameters as small as 82 nm and having clean walls was obtained in a poly(methyl methacrylate) on a silicon substrate by focusing pulses from a Ne-like Ar, 46.9 nm wavelength, capillary-discharge laser using a freestanding Fresnel zone plate diffracting into third order is described. Spectroscopic analysis of light from the ablation has also been performed. These results demonstrate the use of focused coherent EUV/SXR light for the direct nanoscale patterning of materials.

Abstract: Direct patterning of nanometer scale features by interferometric lithography using a 46.9 nm laser is described. Multiple exposures using a Lloyd's mirror interferometer permitted printing of arrays having 60 nm FWHM features.

Abstract: Direct patterning of nanometer scale features by interferometric lithography using a 46.9 nm laser is described. Multiple exposures using a Lloyd's mirror interferometer permitted printing of arrays having 60 nm FWHM features.