Patents by Inventor Carolina RENDÓN-BARRAZA

Carolina RENDÓN-BARRAZA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for characterizing an object
    Patent number: 11480515
    Abstract: An optical method of characterizing an object comprises providing an object to be characterized, the object having at least one nanoscale feature; illuminating the object with coherent plane wave optical radiation having a wavelength larger than the nanoscale feature; capturing a diffraction intensity pattern of the radiation which is scattered by the object; supplying the diffraction intensity pattern to a neural network trained with a training set of diffraction intensity patterns corresponding to other objects with a same nanoscale feature as the object to be characterized, the neural network configured to recover information about the object from the diffraction intensity pattern; and making a characterization of the object based on the recovered information.
    Type: Grant
    Filed: June 12, 2020
    Date of Patent: October 25, 2022
    Assignees: University of Southampton, Nanyang Technological University
    Inventors: Nikolay Ivanovich Zheludev, Nikitas Papasimakis, Jun-Yu Ou, Tanchao Pu, Sergei Kurdiumov, Eng Aik Chan, Carolina Rendón-Barraza
  • METHOD AND APPARATUS FOR CHARACTERIZING AN OBJECT
    Publication number: 20210389227
    Abstract: An optical method of characterizing an object comprises providing an object to be characterized, the object having at least one nanoscale feature; illuminating the object with coherent plane wave optical radiation having a wavelength larger than the nanoscale feature; capturing a diffraction intensity pattern of the radiation which is scattered by the object; supplying the diffraction intensity pattern to a neural network trained with a training set of diffraction intensity patterns corresponding to other objects with a same nanoscale feature as the object to be characterized, the neural network configured to recover information about the object from the diffraction intensity pattern; and making a characterization of the object based on the recovered information.
    Type: Application
    Filed: June 12, 2020
    Publication date: December 16, 2021
    Inventors: Nikolay Ivanovich ZHELUDEV, Nikitas PAPASIMAKIS, Jun-Yu OU, Tanchao PU, Sergei KURDIUMOV, Eng Aik CHAN, Carolina RENDÓN-BARRAZA