Patents by Inventor Carrie Rule

Carrie Rule has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Manufacturing device control based on metrology data
    Patent number: 10809693
    Abstract: A method includes receiving topic names from a metrology interface device, where the topic names correspond to data generated by metrology devices associated with a manufacturing operation. The method also includes accessing a data stream from the metrology interface device. The data stream includes converted metrology data (in a common format) from the metrology devices and corresponding topic names. The method further includes extracting first converted metrology data from the data stream based on a first topic name of the topic names. The first converted metrology data is generated by converting first metrology data from a first metrology device of the metrology devices to the first converted metrology data having the common format. The method also includes comparing the first converted metrology data to a specification, detecting a condition based on the comparison, and sending a command to a manufacturing device based on the condition.
    Type: Grant
    Filed: June 8, 2018
    Date of Patent: October 20, 2020
    Assignee: THE BOEING COMPANY
    Inventors: Lorrie Sivich, Robert W. Grube, Joseph Doyle, Farshad Forouhar, Jerry D. Zayic, Gregg W. Podnar, Carrie Rule
  • MANUFACTURING DEVICE CONTROL BASED ON METROLOGY DATA
    Publication number: 20190377319
    Abstract: A method includes receiving topic names from a metrology interface device, where the topic names correspond to data generated by metrology devices associated with a manufacturing operation. The method also includes accessing a data stream from the metrology interface device. The data stream includes converted metrology data (in a common format) from the metrology devices and corresponding topic names. The method further includes extracting first converted metrology data from the data stream based on a first topic name of the topic names. The first converted metrology data is generated by converting first metrology data from a first metrology device of the metrology devices to the first converted metrology data having the common format. The method also includes comparing the first converted metrology data to a specification, detecting a condition based on the comparison, and sending a command to a manufacturing device based on the condition.
    Type: Application
    Filed: June 8, 2018
    Publication date: December 12, 2019
    Inventors: Lorrie Sivich, Robert W. Grube, Joseph Doyle, Farshad Forouhar, Jerry D. Zayic, Gregg W. Podnar, Carrie Rule