Abstract: An analysis system includes induction coupled plasma apparatus into which sample material to be analyzed is introduced for excitation in the plasma, optical measuring apparatus coupled to the induction coupled plasma apparatus for analyzing the sample material, and mass spectrometer apparatus also coupled to the induction coupled plasma apparatus for analyzing the sample material. The mass spectrometer apparatus includes structure defining a first region, a sampling member adjacent the induction coupled plasma apparatus that has an orifice through which at least some ions characteristic of the sample material may pass into the first region, structure defining a second region, and a gate valve between the first and second regions. The gate valve is open when the analysis system is operating in mass spectrometer mode, and is closed when the system is operating only in optical measuring mode.

Abstract: A sample processing system for use with analysis apparatus includes tubular structure that defines a continuous elongated flow chamber. The tubular structure has an inlet port at one end, an outlet port at the other end, and a sample inlet port in communication with the continuous elongated flow chamber between the inlet and outlet ports. A first pump flows diluent at a first rate through the inlet port for flow through the continuous elongated flow chamber, and a second pump flows a liquid mixture from the continuous elongated flow chamber through the outlet port at a rate greater than the first rate. With the sample inlet port submerged in a sample to be analyzed, the sample is aspirated through the sample inlet port into the flowing diluent stream in the continuous elongated flow chamber for dilution and application of the diluted sample mixture to sample analysis apparatus for analysis.