Patents by Inventor Carsten Illenseer

Carsten Illenseer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11806185
    Abstract: A computer-implemented method is for determining at least one main acquisition parameter determining a dose of x-rays to be emitted from an x-ray emitter during image acquisition using an x-ray emitter and an x-ray detector. A first image data of a first preparatory image is evaluated to determine if a repeat condition is fulfilled and/or to determine the main acquisition parameter and/or at least one second preparatory acquisition parameter. The first preparatory image is acquired by the x-ray detector using at least one first preparatory acquisition parameter to control the x-ray emitter. In all cases or when the repeat condition is fulfilled, the main acquisition parameter is determined depending on second image data of a second preparatory image, acquired by the x-ray detector after the first preparatory image while at least one second preparatory acquisition parameter is used to control the x-ray emitter.
    Type: Grant
    Filed: January 7, 2021
    Date of Patent: November 7, 2023
    Assignee: Siemens Healthcare GmbH
    Inventors: Andre Gebhardt, Sebastian Glawion, Thilo Hannemann, Carsten Illenseer, Daniel Lerch, Thomas Pfeiffer, Stefan Schaffert, Peter Scheuering, Bastian Schmidt, Thomas Weber, Wei He, Sven-Martin Sutter, Zhi Ming Yang
  • Publication number: 20210236081
    Abstract: A computer-implemented method is for determining at least one main acquisition parameter determining a dose of x-rays to be emitted from an x-ray emitter during image acquisition using an x-ray emitter and an x-ray detector. A first image data of a first preparatory image is evaluated to determine if a repeat condition is fulfilled and/or to determine the main acquisition parameter and/or at least one second preparatory acquisition parameter. The first preparatory image is acquired by the x-ray detector using at least one first preparatory acquisition parameter to control the x-ray emitter. In all cases or when the repeat condition is fulfilled, the main acquisition parameter is determined depending on second image data of a second preparatory image, acquired by the x-ray detector after the first preparatory image while at least one second preparatory acquisition parameter is used to control the x-ray emitter.
    Type: Application
    Filed: January 7, 2021
    Publication date: August 5, 2021
    Applicant: Siemens Healthcare GmbH
    Inventors: Andre GEBHARDT, Sebastian GLAWION, Thilo HANNEMANN, Carsten ILLENSEER, Daniel LERCH, Thomas PFEIFFER, Stefan SCHAFFERT, Peter SCHEUERING, Bastian SCHMIDT, Thomas WEBER, Wei HE, Sven-Martin SUTTER, Zhi Ming YANG
  • Patent number: 8981313
    Abstract: A method is provided for detecting x-ray quanta incident on a multi-pixel x-ray detector having a two-dimensional matrix composed of measurement-signal-generating pixels, wherein the multi-pixel x-ray detector is embodied as a direct solid-state detector, wherein the pixels, which generate a measurement signal within a predefined time interval and which in addition lie in a contiguous cluster composed of a plurality of pixels, are assigned to an event cluster by an evaluation unit and wherein their measurement signals are drawn upon for the purpose of approximating the position at which the x-ray quantum interacted with the multi-pixel x-ray detector.
    Type: Grant
    Filed: October 24, 2012
    Date of Patent: March 17, 2015
    Assignee: Siemens Aktiengesellschaft
    Inventors: Franz Atzinger, Gerhard Hahm, Raphael Henrich, Carsten Illenseer, Christoph Jablonski, Bernhard Sandkamp, Markus Schild, Michael Stark, Fabian Wloka
  • Patent number: 8804907
    Abstract: An X-ray detector of conventional design having photodiodes and scintillator material arranged thereon is able, given a suitable read-out frequency matching a low dose to which the flat-panel X-ray detector is subjected, to obtain images during each read-out operation, from which images the energy of individual X-ray quanta can be derived. An item of X-ray-spectrum information about pixels in a grid pattern can be obtained thereby.
    Type: Grant
    Filed: March 30, 2012
    Date of Patent: August 12, 2014
    Assignee: Siemens Aktiengesellschaft
    Inventors: Franz Atzinger, Gerhard Hahm, Raphael Henrich, Carsten Illenseer, Christoph Jablonski, Bernhard Sandkamp, Markus Schild, Michael Stark, Fabian Wloka
  • Patent number: 8723120
    Abstract: A sensor element is provided for conversion of x-radiation into an electrical measurement signal, the sensor element including an x-radiation-absorbing fluid arranged in a housing, and a pressure sensor arranged to detect a pressure of the fluid on the pressure sensor and convert the detected pressure into an electrical measurement signal. A plurality of such sensor elements may be arranged in a matrix-type arrangement to form an x-ray detector.
    Type: Grant
    Filed: February 23, 2012
    Date of Patent: May 13, 2014
    Assignee: Siemens Aktiengesellschaft
    Inventors: Franz Atzinger, Gerhard Hahm, Raphael Henrich, Carsten Illenseer, Christoph Jablonski, Bernhard Sandkamp, Markus Schild, Michael Stark, Fabian Wloka
  • Publication number: 20130003934
    Abstract: An X-ray detector of conventional design having photodiodes and scintillator material arranged thereon is able, given a suitable read-out frequency matching a low dose to which the flat-panel X-ray detector is subjected, to obtain images during each read-out operation, from which images the energy of individual X-ray quanta can be derived. An item of X-ray-spectrum information about pixels in a grid pattern can be obtained thereby.
    Type: Application
    Filed: March 30, 2012
    Publication date: January 3, 2013
    Inventors: Franz Atzinger, Gerhard Hahm, Raphael Henrich, Carsten Illenseer, Christoph Jablonski, Bernhard Sandkamp, Markus Schild, Michael Stark, Fabian Wloka
  • Publication number: 20120261584
    Abstract: A sensor element is provided for conversion of x-radiation into an electrical measurement signal, the sensor element including an x-radiation-absorbing fluid arranged in a housing, and a pressure sensor arranged to detect a pressure of the fluid on the pressure sensor and convert the detected pressure into an electrical measurement signal. A plurality of such sensor elements may be arranged in a matrix-type arrangement to form an x-ray detector.
    Type: Application
    Filed: February 23, 2012
    Publication date: October 18, 2012
    Inventors: Franz Atzinger, Gerhard Hahm, Raphael Henrich, Carsten Illenseer, Christoph Jablonski, Bernhard Sandkamp, Markus Schild, Michael Stark, Fabian Wloka