Abstract: An optical inspection system (92) for inspecting a workpiece (10) including a feature (60) to be inspected is provided. The system (92) includes a workpiece transport conveyor (26) configured to transport the workpiece (10) in a nonstop manner. The system (92) also includes an illuminator (9) configured to provide a first strobed illumination field type and a second strobed illumination field type. An array of cameras (4) is configured to digitally image the feature, wherein the array of cameras (4) is configured to generate a first image of the feature with the first illumination field and a second image of the feature with the second illumination field. A processing device (90) is operably coupled to the illuminator (9) and the array of cameras (4), the processing device (90) provides an inspection result relative to the feature (60) on the workpiece (10) based, at least in part, upon the first and second images.