Abstract: Systems and methods for screening capacitors are disclosed. An exemplary method may comprise charging at least one capacitor for time t1 and then implementing the following operations. After charging time t1, comparing a charge state of the at least one capacitor to thresholds th1-low and th1-high for a capacitance screening operation. After waiting time t2, comparing the charge state of the at least one capacitor to a threshold th2 for an Equivalent Series Resistance (ESR) screening operation. After waiting time t3, comparing a change in the charge state of the at least one capacitor to a threshold th3 for a Leakage Current (LC) and Self-Discharge (SD) screening operation. The screening operations may be implemented manually by a user and/or automatically by the exemplary system described herein.