Abstract: Solid-type SERS-active substrates (e.g., noble metallic nanostructured powders or noble metallic nanoparticle-coatings on beads, microbeads, particles, etc.) are contained within optically-transparent modules. The modules allow for the controlled introduction of analyte-bearing fluid(s) into SERS-active substrates. The modules also allow for the monitoring of SERS signals emanating from analyte(s) which have accumulated on the confined SERS-active substrates. These SERS signals may be monitored over time by direct readout of the SERS substrates through the optically transparent module for chemical analysis and chemical detection applications.

Abstract: Solid-type SERS-active substrates (e.g., noble metallic nanostructured powders or noble metallic nanoparticle-coatings on beads, microbeads, particles, etc.) are contained within optically-transparent modules. The modules allow for the controlled introduction of analyte-bearing fluid(s) into SERS-active substrates. The modules also allow for the monitoring of SERS signals emanating from analyte(s) which have accumulated on the confined SERS-active substrates. These SERS signals may be monitored over time by direct readout of the SERS substrates through the optically transparent module for chemical analysis and chemical detection applications.

Abstract: A series of electronic-chemometric control processes to enhance the selectivity, concentration, analysis, and detec tion of chemical species (analytes) in the gas phase, such as when using SERS-based techniques. Controls consist variously of: 1) feedback of electronic signals corresponding to changes of static and variable parameters in targeted chemical species that vary according to a reduction, increase, maximization, linearization, or improved confidence in one or more chemometric output parameters; 2) methods for spatially locating the source of an analyte species; and, 3) variable duty cycling to save power and materials according to altered physical and environmental conditions within a monitored zone.

Abstract: The present invention comprises an apparatus and a method for using multiple scanning probes to deconvolve tip artifacts in scanning probe microscopes and other scanning probe systems. The invention uses multiple scanning probe tips of different geometries or orientations to scan a feature, such as a semiconductor line or trench, and to display the scan data such that tip artifacts from each tip can be omitted from the measurement by data from the other tips.

Abstract: A method and apparatus for scanning multiple scanning probe microscopes in close proximity, to scan overlapping scan areas at the same time while avoiding collision employs a control system providing drive signals to a first Atomic Force Microscope (AFM) and calculated drive signals to additional AFMs based on the first drive signals and the relative position of the additional AFMs to the first AFM for consistent spaced motion. Scanning and Failure Analysis (FA) probing of multiple feature of interest using multiple APMs allows for reduced time for locating FA features to set up measurements.

Abstract: A method and apparatus for scanning multiple scanning probe microscopes in close proximity, to scan overlapping scan areas at the same time while avoiding collision employs a control system providing drive signals to a first Atomic Force Microscope (AFM) and calculated drive signals to additional AFMs based on the first drive signals and the relative position of the additional AFMs to the first AFM for consistent spaced motion. Scanning and Failure Analysis (FA) probing of multiple feature of interest using multiple APMs allows for reduced time for locating FA features to set up measurements.