Patents by Inventor Catherine E. McManus

Catherine E. McManus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11946870
    Abstract: Methods, systems, and apparatus for distributed ledger for physical material. In one aspect, a method includes obtaining a first set of information regarding a physical material to be verified, the first set of information including hundreds of values for channels of a spectrum of electromagnetic radiation emitted by the physical material in response to an irradiation of the physical material; obtaining a second set of information regarding the physical material to be verified; sending the first and second sets of information over the communication network to a verification computer system; receiving verification information; initiating addition of information usable to identify the first set of information and the digital signature to a distributed digital ledger; receiving confirmation of the addition of the information useable to identify the first set of information and the digital signature to the distributed digital ledger; and reporting that the physical material has been verified.
    Type: Grant
    Filed: May 22, 2018
    Date of Patent: April 2, 2024
    Assignee: MAT International Holdings, LLC
    Inventors: Catherine E. McManus, James W. Dowe, III
  • Patent number: 11248961
    Abstract: The disclosure features methods for analyzing a sample, the methods including exposing the sample to plurality of pulses of electromagnetic radiation to convert a portion of the sample into a plasma, recording a spectrum of electromagnetic radiation emitted in response to each of the plurality of pulses to define a sequence of spectra for the sample, and using an electronic processor to determine information about the sample based on the spectra, where exposing the sample to the plurality of pulses of electromagnetic radiation includes directing the pulses to be incident on different spatial regions of the sample, and where a temporal delay between exposing the sample to each successive radiation pulse is constant.
    Type: Grant
    Filed: March 12, 2014
    Date of Patent: February 15, 2022
    Assignee: MAT International Holdings, LLC
    Inventors: Catherine E. McManus, James W. Dowe, III, Tristan M. Likes, James W. Dowe, IV, Paul McManus, Nelson Winkless, III, Ashley Shelton, Karly Baughn, Robert Baughn, Regan Orr
  • Publication number: 20200118117
    Abstract: Methods, systems, and apparatus for distributed ledger for physical material. In one aspect, a method includes obtaining a first set of information regarding a physical material to be verified, the first set of information including hundreds of values for channels of a spectrum of electromagnetic radiation emitted by the physical material in response to an irradiation of the physical material; obtaining a second set of information regarding the physical material to be verified; sending the first and second sets of information over the communication network to a verification computer system; receiving verification information; initiating addition of information usable to identify the first set of information and the digital signature to a distributed digital ledger; receiving confirmation of the addition of the information useable to identify the first set of information and the digital signature to the distributed digital ledger; and reporting that the physical material has been verified.
    Type: Application
    Filed: May 22, 2018
    Publication date: April 16, 2020
    Inventors: Catherine E. McManus, James W. Dowe, III
  • Patent number: 9063085
    Abstract: This disclosure relates to a method for analyzing a sample of material. The method includes (a) converting a portion of the sample into a plasma multiple times; (b) recording a spectrum of electromagnetic radiation emitted in response to each of the sample conversions to define a sequence of spectra for the sample, in which each member of the sequence corresponds to the spectrum recorded in response to a different one of the sample conversions; (c) using an electronic processor to compare the sequence of spectra for the sample to a sequence of spectra for each of at least one reference sample in a reference library; and (d) using the electronic processor to determine information about the sample based on the comparison to the reference samples in the library.
    Type: Grant
    Filed: February 20, 2014
    Date of Patent: June 23, 2015
    Assignee: Materialytics, LLC
    Inventors: Catherine E. McManus, James W. Dowe, III, Tristan M. Likes, James W. Dowe, IV
  • Publication number: 20140268133
    Abstract: The disclosure features methods for analyzing a sample, the methods including exposing the sample to plurality of pulses of electromagnetic radiation to convert a portion of the sample into a plasma, recording a spectrum of electromagnetic radiation emitted in response to each of the plurality of pulses to define a sequence of spectra for the sample, and using an electronic processor to determine information about the sample based on the spectra, where exposing the sample to the plurality of pulses of electromagnetic radiation includes directing the pulses to be incident on different spatial regions of the sample, and where a temporal delay between exposing the sample to each successive radiation pulse is constant.
    Type: Application
    Filed: March 12, 2014
    Publication date: September 18, 2014
    Inventors: Catherine E. McManus, James W. Dowe, III, Tristan M. Likes, James W. Dowe, IV, Paul McManus, Nelson Winkless, III, Ashley Shelton, Karly Baughn, Robert Baughn, Regan Orr
  • Publication number: 20140185043
    Abstract: This disclosure relates to a method for analyzing a sample of material. The method includes (a) converting a portion of the sample into a plasma multiple times; (b) recording a spectrum of electromagnetic radiation emitted in response to each of the sample conversions to define a sequence of spectra for the sample, in which each member of the sequence corresponds to the spectrum recorded in response to a different one of the sample conversions; (c) using an electronic processor to compare the sequence of spectra for the sample to a sequence of spectra for each of at least one reference sample in a reference library; and (d) using the electronic processor to determine information about the sample based on the comparison to the reference samples in the library.
    Type: Application
    Filed: February 20, 2014
    Publication date: July 3, 2014
    Applicant: Materialytics, LLC
    Inventors: Catherine E. McManus, James W. Dowe, III, Tristan M. Likes, James W. Dowe, IV
  • Patent number: 8699022
    Abstract: This disclosure relates to a method for analyzing a sample of material. The method includes (a) converting a portion of the sample into a plasma multiple times; (b) recording a spectrum of electromagnetic radiation emitted in response to each of the sample conversions to define a sequence of spectra for the sample, in which each member of the sequence corresponds to the spectrum recorded in response to a different one of the sample conversions; (c) using an electronic processor to compare the sequence of spectra for the sample to a sequence of spectra for each of at least one reference sample in a reference library; and (d) using the electronic processor to determine information about the sample based on the comparison to the reference samples in the library.
    Type: Grant
    Filed: February 6, 2013
    Date of Patent: April 15, 2014
    Assignee: Materialytics, LLC
    Inventors: Catherine E. McManus, James W. Dowe, III, Tristan M. Likes, James W. Dowe, IV