Patents by Inventor Cathy Kardach

Cathy Kardach has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for determining probing locations on IC
    Patent number: 7257507
    Abstract: An apparatus and method for tracing back a probing location to identify the circuit element being probed on a device under test (DUT). The coordinates of the irregularity on the DUT are used to trace back to the logic cone to decipher the root-cause of the irregularity. The Def and Lef files are interrogated using the coordinates to obtain the cell and net data to enable the investigation. Additionally, a schematic viewer is used to investigate the logic cone to potential root-causes for the irregularities.
    Type: Grant
    Filed: June 19, 2006
    Date of Patent: August 14, 2007
    Assignee: Credence Systems Corporation
    Inventors: Hitesh Suri, Cathy Kardach
  • SYSTEM AND METHOD FOR DETERMINING PROBING LOCATIONS ON IC
    Publication number: 20070179731
    Abstract: An apparatus and method for tracing back a probing location to identify the circuit element being probed on a device under test (DUT). The coordinates of the irregularity on the DUT are used to trace back to the logic cone to decipher the root-cause of the irregularity. The Def and Lef files are interrogated using the coordinates to obtain the cell and net data to enable the investigation. Additionally, a schematic viewer is used to investigate the logic cone to potential root-causes for the irregularities.
    Type: Application
    Filed: June 19, 2006
    Publication date: August 2, 2007
    Applicant: CREDENCE SYSTEMS CORPORATION
    Inventors: Hitesh Suri, Cathy Kardach