Abstract: An apparatus is disclosed for automatically testing electronic memory modules. The electronic memory modules are automatically positioned, one at a time, in a test station position for registration with test contacts of a test connector assembly. The test connector assembly includes a mounting fixture which secures the test contacts, such that first ends of the test contacts are appropriately aligned for registering with surface contacts of the electronic memory modules. Second, opposite ends of the test contacts are mounted to a transition board. The transition board has first and second opposite edges, with the first edge having surface contacts which are closely spaced for registering with the test contacts, and the second edge having surface contacts which are more widely spaced than those on the first edge for registering with connector contacts of a tester module. Conductive traces extend between the surface contacts of the first and second edges of the transition board.