Patents by Inventor Cecile Moulin

Cecile Moulin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • DEVICE BASED ON ALKALI METAL NIOBATE COMPRISING A BARRIER LAYER AND MANUFACTURING PROCESS
    Publication number: 20200044138
    Abstract: A piezoelectric device includes at least one upper layer of piezoelectric material based on alkali metal niobate and one lower layer of metal located above a substrate, wherein it comprises a barrier layer of material that is a barrier to the diffusion of alkali metals into the metal and that is inert to the alkali metals of the niobite, the barrier material layer being located between the lower layer of metal and the upper layer of piezoelectric material. A process for producing the device is also provided.
    Type: Application
    Filed: July 31, 2019
    Publication date: February 6, 2020
    Inventors: Aomar HALIMAOUI, Cécile MOULIN, Guillaume RODRIGUEZ
  • Method for detecting surface defects on a substrate and device using said method
    Patent number: 7812942
    Abstract: A method for detecting surface defects, such as slip line type defects, on a substrate designed to be used in electronics, optoelectronics or analogue, including projection of a pattern of light fringes and dark bands onto the substrate, relative displacement of the substrate relative to the pattern, acquisition of a sequence of at least three images of the pattern reflected by the substrate to a sensor, the images corresponding to displacement of the fringes of the pattern, determination of the gradient of the surface of the substrate using displacements of fringes of the pattern, and determination of the presence of a surface defect on the substrate using variations in the gradient of the surface of the substrate. Another embodiment comprises a device using said method.
    Type: Grant
    Filed: March 27, 2008
    Date of Patent: October 12, 2010
    Assignees: S.O.I. Tec Silicon on Insulator Technologies, Altatech Semiconductor
    Inventors: Cécile Moulin, Sophie Moritz, Philippe Gastaldo, François Berger, Jean-Luc Delcarri, Patrice Belin, Christophe Maleville
  • METHOD FOR DETECTING SURFACE DEFECTS ON A SUBSTRATE AND DEVICE USING SAID METHOD
    Publication number: 20090051930
    Abstract: A method for detecting surface defects, such as slip line type defects, on a substrate designed to be used in electronics, optoelectronics or analogue, including projection of a pattern of light fringes and dark bands onto the substrate, relative displacement of the substrate relative to the pattern, acquisition of a sequence of at least three images of the pattern reflected by the substrate to a sensor, the images corresponding to displacement of the fringes of the pattern, determination of the gradient of the surface of the substrate using displacements of fringes of the pattern, and determination of the presence of a surface defect on the substrate using variations in the gradient of the surface of the substrate. Another embodiment comprises a device using said method.
    Type: Application
    Filed: March 27, 2008
    Publication date: February 26, 2009
    Applicants: S.O.I. TEC SILICON ON INSULATOR TECHNOLOGIES, ALTATECH SEMICONDUCTOR
    Inventors: Cecile Moulin, Sophie Moritz, Philippe Gastaldo, Francois Berger, Jean-Luc Delcari, Patrice Belin